Paper Abstract and Keywords |
Presentation |
2014-01-28 15:00
[Poster Presentation]
Analyzing Data-Retention Characteristics of ReRAM Hiroki Yamazawa (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2013-114 Link to ES Tech. Rep. Archives: ICD2013-114 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Resistive RAM (ReRAM) is one of the most promising candidates for next generation nonvolatile memories due to its potential to provide fast write and read, high endurance and low power operation. A conductive filament is generated by a voltage pulse called Forming. ReRAM becomes high/low resistance state when a conductive filament is destroyed/regrown by voltage pulse of reverse/same direction to/as Forming, respectively. High or low resistance is assigned to “1” or “0”. This paper reports data-retention reliability evaluation of ReRAM. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
ReRAM / reliability / data-retention / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 419, ICD2013-114, pp. 37-37, Jan. 2014. |
Paper # |
ICD2013-114 |
Date of Issue |
2014-01-21 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2013-114 Link to ES Tech. Rep. Archives: ICD2013-114 |
Conference Information |
Committee |
ICD |
Conference Date |
2014-01-28 - 2014-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyoto Univ. Tokeidai Kinenkan |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2014-01-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analyzing Data-Retention Characteristics of ReRAM |
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ReRAM |
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reliability |
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data-retention |
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1st Author's Name |
Hiroki Yamazawa |
1st Author's Affiliation |
Chuo University (Chuo Univ.) |
2nd Author's Name |
Shuhei Tanakamaru |
2nd Author's Affiliation |
Chuo University/University of Tokyo (Chuo Univ./Univ. of Tokyo) |
3rd Author's Name |
Ken Takeuchi |
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Chuo University (Chuo Univ.) |
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Speaker |
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Date Time |
2014-01-28 15:00:00 |
Presentation Time |
120 minutes |
Registration for |
ICD |
Paper # |
ICD2013-114 |
Volume (vol) |
vol.113 |
Number (no) |
no.419 |
Page |
p.37 |
#Pages |
1 |
Date of Issue |
2014-01-21 (ICD) |