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Paper Abstract and Keywords
Presentation 2013-12-20 15:50
Estimation for 2r-port S-parameters by the r-Port Measurements
Noboru Maeda, Shinji Fukui, Takashi Naoi (NIPPON SOKEN), Kouji Ichikawa (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2013-107
Abstract (in Japanese) (See Japanese page) 
(in English) An estimation method of the 2r-port S-parameters for reciprocal circuits is presented. In this method, several known loads are connected to r-ports in turn and reflection and transmission characteristics among the remaining r-ports are measured. Therefore, there is no need to connect a network analyzer to the ports that are connected to the known loads. S-parameters are obtained by solving several linear equations and quadratic equations only. In addition, applying this method to estimate the S-parameters of a circuit board as an 8-port circuit, validness of this method is confirmed.
Keyword (in Japanese) (See Japanese page) 
(in English) S-parameter / multiple port circuit / immunity test / automotive components / IC chip / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 368, EMCJ2013-107, pp. 55-60, Dec. 2013.
Paper # EMCJ2013-107 
Date of Issue 2013-12-13 (EMCJ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ IEE-EMC  
Conference Date 2013-12-20 - 2013-12-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Denso co. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Power electronics, Biomedical, EMC, etc. 
Paper Information
Registration To EMCJ 
Conference Code 2013-12-EMCJ-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimation for 2r-port S-parameters by the r-Port Measurements 
Sub Title (in English)  
Keyword(1) S-parameter  
Keyword(2) multiple port circuit  
Keyword(3) immunity test  
Keyword(4) automotive components  
Keyword(5) IC chip  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Noboru Maeda  
1st Author's Affiliation NIPPON SOKEN, INC. (NIPPON SOKEN)
2nd Author's Name Shinji Fukui  
2nd Author's Affiliation NIPPON SOKEN, INC. (NIPPON SOKEN)
3rd Author's Name Takashi Naoi  
3rd Author's Affiliation NIPPON SOKEN, INC. (NIPPON SOKEN)
4th Author's Name Kouji Ichikawa  
4th Author's Affiliation DENSO CORPORATION (DENSO)
5th Author's Name Toshikazu Sekine  
5th Author's Affiliation Gifu University (Gifu Univ.)
6th Author's Name Yasuhiro Takahashi  
6th Author's Affiliation Gifu University (Gifu Univ.)
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Speaker
Date Time 2013-12-20 15:50:00 
Presentation Time 25 
Registration for EMCJ 
Paper # IEICE-EMCJ2013-107 
Volume (vol) IEICE-113 
Number (no) no.368 
Page pp.55-60 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2013-12-13 


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