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Paper Abstract and Keywords
Presentation 2013-12-02 09:30
Measurement for Permittivity and Thickness of Multilayered Dielectric Plate by Through Radar
Hirokazu Kobayashi (Osaka Institute of Tech.) SANE2013-71
Abstract (in Japanese) (See Japanese page) 
(in English) Using wall-through radar, we can obtain image of the front object by means of scanning an antenna mechanically or electrically. In this case information of the wall equivalent permittivity and thickness are necessary in order to compensate the position error of the image caused by the delay phase of the wall. On the contrary, we can estimate electric constant of the wall by comparing with the target image position with no wall. In this paper, we discuss mechanism of radar imaging construction by applying array-factor concept for near position target. Then, showing approximate method for no electrical information wall, from which it is available to estimate equivalent permittivity and thickness of the wall under considering the practical application.
Keyword (in Japanese) (See Japanese page) 
(in English) wall-through radar / array-factor / radar imaging / multilayered dielectric / equivalent permittivity / wall thickness / near-field /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 335, SANE2013-71, pp. 1-6, Dec. 2013.
Paper # SANE2013-71 
Date of Issue 2013-11-25 (SANE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SANE  
Conference Date 2013-12-02 - 2013-12-03 
Place (in Japanese) (See Japanese page) 
Place (in English) VAST/VNSC(2nd Dec.) & Melia Hotel (3rd Dec), Hanoi, Vietnam 
Topics (in Japanese) (See Japanese page) 
Topics (in English) ICSANE 2013 (International Conference on Space, Aeronautical and Navigational Electronics) 
Paper Information
Registration To SANE 
Conference Code 2013-12-SANE 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement for Permittivity and Thickness of Multilayered Dielectric Plate by Through Radar 
Sub Title (in English)  
Keyword(1) wall-through radar  
Keyword(2) array-factor  
Keyword(3) radar imaging  
Keyword(4) multilayered dielectric  
Keyword(5) equivalent permittivity  
Keyword(6) wall thickness  
Keyword(7) near-field  
1st Author's Name Hirokazu Kobayashi  
1st Author's Affiliation Osaka Institute of Technology (Osaka Institute of Tech.)
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Date Time 2013-12-02 09:30:00 
Presentation Time 20 
Registration for SANE 
Paper # IEICE-SANE2013-71 
Volume (vol) IEICE-113 
Number (no) no.335 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-SANE-2013-11-25 

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