IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-11-14 14:25
Effective non-destructive defect localization by using Enhanced Lock-In Thermography
Toshinobu Nagatomo (DCG Systems) R2013-75
Abstract (in Japanese) (See Japanese page) 
(in English) ELITE has been widely accepted as an effective non- destructive defect localization tool. It is based on Lock-in Thermography (LIT) utilizing highly sensitive IR camera and serves not only for semiconductor failure analysis but also more electrical failure analysis applications widely. In this paper the basic of LIT is to be presented and several real test cases are introduced.
Keyword (in Japanese) (See Japanese page) 
(in English) Lock-in thermography / non-destructive / defect localization / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 289, R2013-75, pp. 5-9, Nov. 2013.
Paper # R2013-75 
Date of Issue 2013-11-07 (R) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2013-75

Conference Information
Committee R  
Conference Date 2013-11-14 - 2013-11-14 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2013-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Effective non-destructive defect localization by using Enhanced Lock-In Thermography 
Sub Title (in English)  
Keyword(1) Lock-in thermography  
Keyword(2) non-destructive  
Keyword(3) defect localization  
1st Author's Name Toshinobu Nagatomo  
1st Author's Affiliation DCG Systems, G.K. (DCG Systems)
2nd Author's Name  
2nd Author's Affiliation ()
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2013-11-14 14:25:00 
Presentation Time 25 
Registration for R 
Paper # IEICE-R2013-75 
Volume (vol) IEICE-113 
Number (no) no.289 
Page pp.5-9 
#Pages IEICE-5 
Date of Issue IEICE-R-2013-11-07 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan