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Paper Abstract and Keywords
Presentation 2013-10-18 09:30
Si photodiode wiht high sensitivity and high stability to UV-light with 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack
Yasumasa Koda, Rihito Kuroda, Yukihisa Nakao, Shigetoshi Sugawa (Tohoku Univ.) SDM2013-92 Link to ES Tech. Rep. Archives: SDM2013-92
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Reference Info. IEICE Tech. Rep., vol. 113, no. 247, SDM2013-92, pp. 21-25, Oct. 2013.
Paper # SDM2013-92 
Date of Issue 2013-10-10 (SDM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee SDM  
Conference Date 2013-10-17 - 2013-10-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Niche, Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process Science and New Process Technology 
Paper Information
Registration To SDM 
Conference Code 2013-10-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Si photodiode wiht high sensitivity and high stability to UV-light with 100% internal Q.E. and high transmittance on-chip multilayer dielectric stack 
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1st Author's Name Yasumasa Koda  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Rihito Kuroda  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Yukihisa Nakao  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Shigetoshi Sugawa  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker
Date Time 2013-10-18 09:30:00 
Presentation Time 30 
Registration for SDM 
Paper # IEICE-SDM2013-92 
Volume (vol) IEICE-113 
Number (no) no.247 
Page pp.21-25 
#Pages IEICE-5 
Date of Issue IEICE-SDM-2013-10-10 


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