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| Presentation | 2013-08-23 14:55 Estimation of Equivalent Permittivity and Thickness of Multilayered Dielectric by Wall-through Radar Hirokazu Kobayashi (Osaka Inst. of Tech.), Shun-ichi Takaoka, Yoshio Yamaguchi (Niigata Univ.), Hong Zhou (Osaka Inst. of Tech.)  SANE2013-49 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | By wall-through radar, we can acquire image of the front object by scanning an antenna mechanically or electrically.In this case information of the wall equivalent permittivity and thickness are necessary in order to compensate the position error of the image caused by the delay phase of the wall. On the contrary, we can estimate electric constant of the wall by comparing with the target image position with no wall.In this paper, we discuss mechanism of radar imaging construction by applying array-factor concept for near position target, and then show approximate method for no electrical information wall, which estimate equivalent permittivity and thickness of the wall under considering the practical application. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | wall-through radar / array-factor / radar imaging / multilayered dielectric / equivalent permittivity / wall thickness / environmental measurement / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 184, SANE2013-49, pp. 23-30, Aug. 2013. | |
| Paper # | SANE2013-49 | |
| Date of Issue | 2013-08-16 (SANE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SANE2013-49 |
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| Conference Information | |
| Committee | SANE |
| Conference Date | 2013-08-23 - 2013-08-23 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Niigata University Igarashi campus |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Environmental measurement and general |
| Paper Information | |
| Registration To | SANE |
| Conference Code | 2013-08-SANE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Estimation of Equivalent Permittivity and Thickness of Multilayered Dielectric by Wall-through Radar |
| Sub Title (in English) | |
| Keyword(1) | wall-through radar |
| Keyword(2) | array-factor |
| Keyword(3) | radar imaging |
| Keyword(4) | multilayered dielectric |
| Keyword(5) | equivalent permittivity |
| Keyword(6) | wall thickness |
| Keyword(7) | environmental measurement |
| Keyword(8) | |
| 1st Author's Name | Hirokazu Kobayashi |
| 1st Author's Affiliation | Osaka Institute of Tecnology (Osaka Inst. of Tech.) |
| 2nd Author's Name | Shun-ichi Takaoka |
| 2nd Author's Affiliation | Niigata University (Niigata Univ.) |
| 3rd Author's Name | Yoshio Yamaguchi |
| 3rd Author's Affiliation | Niigata University (Niigata Univ.) |
| 4th Author's Name | Hong Zhou |
| 4th Author's Affiliation | Osaka Institute of Tecnology (Osaka Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2013-08-23 14:55:00 |
| Presentation Time | 25 minutes |
| Registration for | SANE |
| Paper # | SANE2013-49 |
| Volume (vol) | vol.113 |
| Number (no) | no.184 |
| Page | pp.23-30 |
| #Pages | 8 |
| Date of Issue | 2013-08-16 (SANE) |
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