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Paper Abstract and Keywords
Presentation 2013-07-12 10:35
Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillation mechanism (28) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24 Link to ES Tech. Rep. Archives: EMD2013-24
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mechanism (HOM) which they have designed and developed. In addition, they have proposed a simple and practical protocol 1 in the transient condition to evaluate the fundamental dynamical parameter such as effective mass, effective force and effective acceleration of the electrical devices on the PCB (printed circuit board), which are comparatively lightweight, only using experimental acceleration values.
In this paper, they estimate or calculate the distributions of the above dynamical parameters on the PCB and introduce an additional mass parameter in addition to the above dynamical parameters. They consider the influence of an additional mass which is indispensable for the protocol and the validation of the dynamical parameters.
And they also propose a new protocol 2 in sub-steady-state condition to evaluate natural frequency and damping ratio, which complements the protocol 1.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / effective mass / effective force / effective acceleration / additional mass / hammering oscillation mechanism  
Reference Info. IEICE Tech. Rep., vol. 113, no. 126, EMD2013-24, pp. 1-6, July 2013.
Paper # EMD2013-24 
Date of Issue 2013-07-05 (EMCJ, EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Download PDF EMCJ2013-39 EMD2013-24 Link to ES Tech. Rep. Archives: EMD2013-24

Conference Information
Committee EMCJ EMD  
Conference Date 2013-07-12 - 2013-07-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Discharge, EMC, etc. 
Paper Information
Registration To EMD 
Conference Code 2013-07-EMCJ-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism 
Sub Title (in English) A fundamental study on the performance of the hammering oscillation mechanism (28) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) effective mass  
Keyword(5) effective force  
Keyword(6) effective acceleration  
Keyword(7) additional mass  
Keyword(8) hammering oscillation mechanism  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Hiroaki Kubota  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Koichiro Sawa  
5th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker
Date Time 2013-07-12 10:35:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMCJ2013-39,IEICE-EMD2013-24 
Volume (vol) IEICE-113 
Number (no) no.125(EMCJ), no.126(EMD) 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-EMCJ-2013-07-05,IEICE-EMD-2013-07-05 


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