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Paper Abstract and Keywords
Presentation 2013-07-05 17:40
Failure mode analysis for flip-flops at low voltages
Takafumi Fujita, Junya Kawashima, Masayuki Hiromoto (Kyouto Univ.), Hiroshi Tsutsui (Hokkaido Univ.), Hiroyuki Ochi (Ritsumeikan Univ.), Takashi Sato (Kyouto Univ.) ICD2013-45 Link to ES Tech. Rep. Archives: ICD2013-45
Abstract (in Japanese) (See Japanese page) 
(in English) Towards the reducing power consumption, subthreshold circuit which operates at a low voltage below the threshold voltage of the transistor has been widely researched.
The low power supply voltage circuits, variation for the minimum operation voltage which is defined by the minimum supply voltage that circuit is operable, and circuit design considering timing variation are important to obtain appropriate yield.
In this paper, we focus on the flip-flop minimum operation voltage especially in the standard cells.
Static failure modes are classified as a factor of the minimum operation voltage, and timing constraints are analyzed.
By analyzing the failure modes,it will be possible to identify the logic circuit elements which are frangible in low supply voltage.
In low supply voltage operation, as compared with the combination circuit, it was found that there is not need to assign many timing margin to sequential circuit.
Keyword (in Japanese) (See Japanese page) 
(in English) Subthreshold circuit / minimum operation voltage / timing constraint / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 112, ICD2013-45, pp. 129-134, July 2013.
Paper # ICD2013-45 
Date of Issue 2013-06-27 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2013-45 Link to ES Tech. Rep. Archives: ICD2013-45

Conference Information
Committee ICD ITE-IST  
Conference Date 2013-07-04 - 2013-07-05 
Place (in Japanese) (See Japanese page) 
Place (in English) San Refre Hakodate 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface Circuitry 
Paper Information
Registration To ICD 
Conference Code 2013-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Failure mode analysis for flip-flops at low voltages 
Sub Title (in English)  
Keyword(1) Subthreshold circuit  
Keyword(2) minimum operation voltage  
Keyword(3) timing constraint  
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1st Author's Name Takafumi Fujita  
1st Author's Affiliation Kyouto University (Kyouto Univ.)
2nd Author's Name Junya Kawashima  
2nd Author's Affiliation Kyouto University (Kyouto Univ.)
3rd Author's Name Masayuki Hiromoto  
3rd Author's Affiliation Kyouto University (Kyouto Univ.)
4th Author's Name Hiroshi Tsutsui  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
5th Author's Name Hiroyuki Ochi  
5th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
6th Author's Name Takashi Sato  
6th Author's Affiliation Kyouto University (Kyouto Univ.)
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Speaker
Date Time 2013-07-05 17:40:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2013-45 
Volume (vol) IEICE-113 
Number (no) no.112 
Page pp.129-134 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2013-06-27 


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