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Paper Abstract and Keywords
Presentation 2013-07-05 16:50
A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET
Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) ICD2013-43 Link to ES Tech. Rep. Archives: ICD2013-43
Abstract (in Japanese) (See Japanese page) 
(in English) In this work, we measured 1/f noise of Independent-Double-Gate- (IDG-) FinFET which has two independent gates. Flicker noise of Common-Double-Gate- (CDG-) mode which both gates are applied with the same voltage and IDG-mode that has one gate voltage grounded and the other gate voltage applied with arbitrary voltage, and both result were compared with the same drain current (Id). First, we measured relationship between characteristic of the normalized 1/f noise by Id (SId/Id2) and characteristic of Id. Both the SId/Id2 of IDG-mode and CDG-mode show nearly equal values and tendency. Next, this work also shows the relationship between 1/f noise and vertical electric field (E⊥) of surface of gate oxide film. As a result we could not definitely see a large margin of 1/f noise between CDG-mode and IDG-mode from E⊥. This work also discovered that 1/f noise was greatly influenced by Id density.
Keyword (in Japanese) (See Japanese page) 
(in English) 1/f noise / Flicker noise / SOI / Double-gate / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 112, ICD2013-43, pp. 119-124, July 2013.
Paper # ICD2013-43 
Date of Issue 2013-06-27 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Download PDF ICD2013-43 Link to ES Tech. Rep. Archives: ICD2013-43

Conference Information
Committee ICD ITE-IST  
Conference Date 2013-07-04 - 2013-07-05 
Place (in Japanese) (See Japanese page) 
Place (in English) San Refre Hakodate 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface Circuitry 
Paper Information
Registration To ICD 
Conference Code 2013-07-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET 
Sub Title (in English)  
Keyword(1) 1/f noise  
Keyword(2) Flicker noise  
Keyword(3) SOI  
Keyword(4) Double-gate  
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1st Author's Name Hideo Sakai  
1st Author's Affiliation Keio University (Keio Univ.)
2nd Author's Name Shin-ichi O'uchi  
2nd Author's Affiliation National Institute of AIST (AIST)
3rd Author's Name Kazuhiko Endo  
3rd Author's Affiliation National Institute of AIST (AIST)
4th Author's Name Takashi Matsukawa  
4th Author's Affiliation National Institute of AIST (AIST)
5th Author's Name Yongxun Liu  
5th Author's Affiliation National Institute of AIST (AIST)
6th Author's Name Yuki Ishikawa  
6th Author's Affiliation National Institute of AIST (AIST)
7th Author's Name Junichi Tsukada  
7th Author's Affiliation National Institute of AIST (AIST)
8th Author's Name Tadashi Nakagawa  
8th Author's Affiliation National Institute of AIST (AIST)
9th Author's Name Toshihiro Sekigawa  
9th Author's Affiliation National Institute of AIST (AIST)
10th Author's Name Hanpei Koike  
10th Author's Affiliation National Institute of AIST (AIST)
11th Author's Name Meishoku Masahara  
11th Author's Affiliation National Institute of AIST (AIST)
12th Author's Name Hiroki Ishikuro  
12th Author's Affiliation Keio University (Keio Univ.)
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Speaker
Date Time 2013-07-05 16:50:00 
Presentation Time 25 
Registration for ICD 
Paper # IEICE-ICD2013-43 
Volume (vol) IEICE-113 
Number (no) no.112 
Page pp.119-124 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2013-06-27 


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