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| Presentation | 2013-07-05 16:50 A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.)  ICD2013-43 Link to ES Tech. Rep. Archives: ICD2013-43 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this work, we measured 1/f noise of Independent-Double-Gate- (IDG-) FinFET which has two independent gates. Flicker noise of Common-Double-Gate- (CDG-) mode which both gates are applied with the same voltage and IDG-mode that has one gate voltage grounded and the other gate voltage applied with arbitrary voltage, and both result were compared with the same drain current (Id). First, we measured relationship between characteristic of the normalized 1/f noise by Id (SId/Id2) and characteristic of Id. Both the SId/Id2 of IDG-mode and CDG-mode show nearly equal values and tendency. Next, this work also shows the relationship between 1/f noise and vertical electric field (E⊥) of surface of gate oxide film. As a result we could not definitely see a large margin of 1/f noise between CDG-mode and IDG-mode from E⊥. This work also discovered that 1/f noise was greatly influenced by Id density. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | 1/f noise / Flicker noise / SOI / Double-gate / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 112, ICD2013-43, pp. 119-124, July 2013. | |
| Paper # | ICD2013-43 | |
| Date of Issue | 2013-06-27 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2013-43 Link to ES Tech. Rep. Archives: ICD2013-43 |
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| Conference Information | |
| Committee | ICD ITE-IST |
| Conference Date | 2013-07-04 - 2013-07-05 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | San Refre Hakodate |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed Analog and Digital, RF, and Sensor Interface Circuitry |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2013-07-ICD-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET |
| Sub Title (in English) | |
| Keyword(1) | 1/f noise |
| Keyword(2) | Flicker noise |
| Keyword(3) | SOI |
| Keyword(4) | Double-gate |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hideo Sakai |
| 1st Author's Affiliation | Keio University (Keio Univ.) |
| 2nd Author's Name | Shin-ichi O'uchi |
| 2nd Author's Affiliation | National Institute of AIST (AIST) |
| 3rd Author's Name | Kazuhiko Endo |
| 3rd Author's Affiliation | National Institute of AIST (AIST) |
| 4th Author's Name | Takashi Matsukawa |
| 4th Author's Affiliation | National Institute of AIST (AIST) |
| 5th Author's Name | Yongxun Liu |
| 5th Author's Affiliation | National Institute of AIST (AIST) |
| 6th Author's Name | Yuki Ishikawa |
| 6th Author's Affiliation | National Institute of AIST (AIST) |
| 7th Author's Name | Junichi Tsukada |
| 7th Author's Affiliation | National Institute of AIST (AIST) |
| 8th Author's Name | Tadashi Nakagawa |
| 8th Author's Affiliation | National Institute of AIST (AIST) |
| 9th Author's Name | Toshihiro Sekigawa |
| 9th Author's Affiliation | National Institute of AIST (AIST) |
| 10th Author's Name | Hanpei Koike |
| 10th Author's Affiliation | National Institute of AIST (AIST) |
| 11th Author's Name | Meishoku Masahara |
| 11th Author's Affiliation | National Institute of AIST (AIST) |
| 12th Author's Name | Hiroki Ishikuro |
| 12th Author's Affiliation | Keio University (Keio Univ.) |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
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| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
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| 17th Author's Affiliation | () |
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| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2013-07-05 16:50:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2013-43 |
| Volume (vol) | vol.113 |
| Number (no) | no.112 |
| Page | pp.119-124 |
| #Pages | 6 |
| Date of Issue | 2013-06-27 (ICD) |
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