Paper Abstract and Keywords |
Presentation |
2013-06-21 15:30
An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) DC2013-13 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper discusses the location of interaction faults in software interaction testing. Specically, we
propose a method of generating a test set that can locate any single pair-wise interaction fault, aimed at reduction of
software development cost. In mathematical terms, such a test set is called a locating array. The proposed method
works as follows. First, a test set is generated using an existing method for pair-wise testing. Second, pair-wise
interactions that cannot be located by the test set are enumerated. Finally, addition of a test case to the test set
is repeated until all pair-wise interactions can be located. We apply the proposed method to some examples to
compare it with a conventional pair-wise testing method with respect to the number of test cases in resulting test
sets. The results of the case study show that the proposed method can enable fault localization at the cost of 2-3
times test set size. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
pair-wise testing / interaction faults / locating array / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 104, DC2013-13, pp. 19-23, June 2013. |
Paper # |
DC2013-13 |
Date of Issue |
2013-06-14 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2013-13 |
Conference Information |
Committee |
DC |
Conference Date |
2013-06-21 - 2013-06-21 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design, Test, Verification |
Paper Information |
Registration To |
DC |
Conference Code |
2013-06-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault |
Sub Title (in English) |
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Keyword(1) |
pair-wise testing |
Keyword(2) |
interaction faults |
Keyword(3) |
locating array |
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1st Author's Name |
Takahiro Nagamoto |
1st Author's Affiliation |
Osaka University (Osaka Univ.) |
2nd Author's Name |
Hideharu Kojima |
2nd Author's Affiliation |
Osaka University (Osaka Univ.) |
3rd Author's Name |
Tatsuhiro Tsuchiya |
3rd Author's Affiliation |
Osaka University (Osaka Univ.) |
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Speaker |
Author-1 |
Date Time |
2013-06-21 15:30:00 |
Presentation Time |
30 minutes |
Registration for |
DC |
Paper # |
DC2013-13 |
Volume (vol) |
vol.113 |
Number (no) |
no.104 |
Page |
pp.19-23 |
#Pages |
5 |
Date of Issue |
2013-06-14 (DC) |
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