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Paper Abstract and Keywords
Presentation 2013-06-21 15:30
An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault
Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) DC2013-13
Abstract (in Japanese) (See Japanese page) 
(in English) This paper discusses the location of interaction faults in software interaction testing. Speci cally, we
propose a method of generating a test set that can locate any single pair-wise interaction fault, aimed at reduction of
software development cost. In mathematical terms, such a test set is called a locating array. The proposed method
works as follows. First, a test set is generated using an existing method for pair-wise testing. Second, pair-wise
interactions that cannot be located by the test set are enumerated. Finally, addition of a test case to the test set
is repeated until all pair-wise interactions can be located. We apply the proposed method to some examples to
compare it with a conventional pair-wise testing method with respect to the number of test cases in resulting test
sets. The results of the case study show that the proposed method can enable fault localization at the cost of 2-3
times test set size.
Keyword (in Japanese) (See Japanese page) 
(in English) pair-wise testing / interaction faults / locating array / / / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 104, DC2013-13, pp. 19-23, June 2013.
Paper # DC2013-13 
Date of Issue 2013-06-14 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2013-13

Conference Information
Committee DC  
Conference Date 2013-06-21 - 2013-06-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2013-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault 
Sub Title (in English)  
Keyword(1) pair-wise testing  
Keyword(2) interaction faults  
Keyword(3) locating array  
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1st Author's Name Takahiro Nagamoto  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Hideharu Kojima  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Tatsuhiro Tsuchiya  
3rd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker
Date Time 2013-06-21 15:30:00 
Presentation Time 30 
Registration for DC 
Paper # IEICE-DC2013-13 
Volume (vol) IEICE-113 
Number (no) no.104 
Page pp.19-23 
#Pages IEICE-5 
Date of Issue IEICE-DC-2013-06-14 


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