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| Presentation | 2013-06-21 14:15 A method of deterministic LFSR seed generation for scan-based BIST Takanori Moriyasu, Satoshi Ohtake (Oita Univ.)  DC2013-11 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper proposes a method of LFSR seed generation for LFSR reseeding of scan-based BIST of VLSI circuits. So far, a scan test pattern detecting some fault is first generated using an ATPG tool and the generated pattern is then converted into a seed. However, the conversion does not always succeed and the fault may not be detected. For a given circuit with scan-based BIST, the proposed method first creates a seed generation model for the circuit. The seed generation model consists of the combinational part of the circuit and the XOR network representing the logic functions of LFSR seed variables for scan flip-flops. LFSR seeds for faults are then generated as test patterns of the seed generation model by using an ATPG tool. In this paper, the effectiveness of the proposed method is shown by experiments using ITC'99 benchmark circuits. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Scan-based BIST / LFSR / reseeding / seed generation / test generation constraint / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 104, DC2013-11, pp. 7-12, June 2013. | |
| Paper # | DC2013-11 | |
| Date of Issue | 2013-06-14 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2013-11 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2013-06-21 - 2013-06-21 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2013-06-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A method of deterministic LFSR seed generation for scan-based BIST |
| Sub Title (in English) | |
| Keyword(1) | Scan-based BIST |
| Keyword(2) | LFSR |
| Keyword(3) | reseeding |
| Keyword(4) | seed generation |
| Keyword(5) | test generation constraint |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Takanori Moriyasu |
| 1st Author's Affiliation | Oita University (Oita Univ.) |
| 2nd Author's Name | Satoshi Ohtake |
| 2nd Author's Affiliation | Oita University (Oita Univ.) |
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| Speaker | Author-1 |
| Date Time | 2013-06-21 14:15:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | DC2013-11 |
| Volume (vol) | vol.113 |
| Number (no) | no.104 |
| Page | pp.7-12 |
| #Pages | 6 |
| Date of Issue | 2013-06-14 (DC) |
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