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Paper Abstract and Keywords
Presentation 2013-06-21 16:30
A Method of Transistor Degradation Estimation Using Ring Oscillators
Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2013-15
Abstract (in Japanese) (See Japanese page) 
(in English) Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot Carrier (CHC) occurs in nanoscale transistors, which is a major factor for degrading the performance of LSIs. Operating speed of transistors is decreased by aging, and LSI malfunctions by a delay in signal propagation. In this paper, we present a method for estimating the amount of increase in delay time and a threshold value per one transistor from change in the period of two ring oscillators by aging. It was verified by circuit simulation that the proposed method can estimate with an error rate of less than 5% of the delay time increase and an error of less than 2% of the threshold voltage increase.
Keyword (in Japanese) (See Japanese page) 
(in English) NBTI / PBTI / CHC / ring oscillators / signal delay / / /  
Reference Info. IEICE Tech. Rep., vol. 113, no. 104, DC2013-15, pp. 31-36, June 2013.
Paper # DC2013-15 
Date of Issue 2013-06-14 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2013-15

Conference Information
Committee DC  
Conference Date 2013-06-21 - 2013-06-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design, Test, Verification 
Paper Information
Registration To DC 
Conference Code 2013-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Method of Transistor Degradation Estimation Using Ring Oscillators 
Sub Title (in English)  
Keyword(1) NBTI  
Keyword(2) PBTI  
Keyword(3) CHC  
Keyword(4) ring oscillators  
Keyword(5) signal delay  
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1st Author's Name Tatsunori Ikeda  
1st Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
2nd Author's Name Yukiya Miura  
2nd Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
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Speaker
Date Time 2013-06-21 16:30:00 
Presentation Time 30 
Registration for DC 
Paper # IEICE-DC2013-15 
Volume (vol) IEICE-113 
Number (no) no.104 
Page pp.31-36 
#Pages IEICE-6 
Date of Issue IEICE-DC-2013-06-14 


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