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Paper Abstract and Keywords
Presentation 2013-02-28 11:20
In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System
Takanari Saito, Ibuki Atsumo, Ryutaro Suda, Mitsuki Ito, Jun-ichi Shirakashi (Tokyo Univ. of Agriculture and Tech.) ED2012-142 SDM2012-171 Link to ES Tech. Rep. Archives: ED2012-142 SDM2012-171
Abstract (in Japanese) (See Japanese page) 
(in English) We report temperature distribution of graphene during Joule heating process using in-situ Near-Infrared (NIR) Charge-Coupled Device (CCD) imaging system. Graphene layers were prepared by using mechanical exfoliation of pyrolytic graphite sheet (PGS), which is commercially available from an industrial materials company, and deposited on SiO2/Si substrate with approximately 780 nm thermally grown oxide. The thickness of the graphenes was estimated to be 20-80 nm by using the Fresnel theory. In order to investigate the heating process of the graphene, the temperature of the graphene under current flow was estimated using NIR microscopy with a CCD detector. A hand-made, in-situ experimental setup consists of an IR microscope, a NIR CCD and an image enhancer. The CCD detector is mounted on the IR microscope with objective 20x. The experiments were carried out in obscurity. The current heating process applied with constant voltage was performed for the graphene in vacuum, and the temperature distribution of the graphene during NIR emission was successfully detected by in-situ NIR CCD imaging system. The temperature of graphene was detected to be approximately 800 K. These results imply that NIR CCD imaging system is a useful tool for the investigation of the temperature distribution of graphene.
Keyword (in Japanese) (See Japanese page) 
(in English) Near-Infrared CCD Imaging / Graphene / In-Situ Measurement / Current-Induced Annealing / Temperature Distribution / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 445, ED2012-142, pp. 77-82, Feb. 2013.
Paper # ED2012-142 
Date of Issue 2013-02-20 (ED, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2012-142 SDM2012-171 Link to ES Tech. Rep. Archives: ED2012-142 SDM2012-171

Conference Information
Committee SDM ED  
Conference Date 2013-02-27 - 2013-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Functional nanodevices and related technologies 
Paper Information
Registration To ED 
Conference Code 2013-02-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System 
Sub Title (in English)  
Keyword(1) Near-Infrared CCD Imaging  
Keyword(2) Graphene  
Keyword(3) In-Situ Measurement  
Keyword(4) Current-Induced Annealing  
Keyword(5) Temperature Distribution  
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1st Author's Name Takanari Saito  
1st Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agriculture and Tech.)
2nd Author's Name Ibuki Atsumo  
2nd Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agriculture and Tech.)
3rd Author's Name Ryutaro Suda  
3rd Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agriculture and Tech.)
4th Author's Name Mitsuki Ito  
4th Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agriculture and Tech.)
5th Author's Name Jun-ichi Shirakashi  
5th Author's Affiliation Tokyo University of Agriculture and Technology (Tokyo Univ. of Agriculture and Tech.)
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Speaker Author-1 
Date Time 2013-02-28 11:20:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2012-142, SDM2012-171 
Volume (vol) vol.112 
Number (no) no.445(ED), no.446(SDM) 
Page pp.77-82 
#Pages
Date of Issue 2013-02-20 (ED, SDM) 


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