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| Presentation | 2013-01-25 10:15 Development of scale down testbed for high voltage power device Takashi Matsuyoshi (KIT), Msanori Tsukuda (ICSEAD/KIT), Hidetoshi Hirai, Ichiro Omura (KIT)  EE2012-46 CPM2012-168 Link to ES Tech. Rep. Archives: CPM2012-168 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The testbed for high voltage power device evaluation was developed. This testbed is constituted by special device package, aluminum block, etc., and realizes a super-low stray inductance. Moreover, ideal switching property evaluation became possible by using this testbed. This testbed is used for measurement of the ultimate performance of a power device, construction of a compact model and the advancement of the gate drive. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | testbed / press-pack / high voltage power device / stray inductance / stray capacitance / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 396, EE2012-46, pp. 105-109, Jan. 2013. | |
| Paper # | EE2012-46 | |
| Date of Issue | 2013-01-17 (EE, CPM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EE2012-46 CPM2012-168 Link to ES Tech. Rep. Archives: CPM2012-168 |
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| Conference Information | |
| Committee | EE CPM |
| Conference Date | 2013-01-24 - 2013-01-25 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EE |
| Conference Code | 2013-01-EE-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Development of scale down testbed for high voltage power device |
| Sub Title (in English) | |
| Keyword(1) | testbed |
| Keyword(2) | press-pack |
| Keyword(3) | high voltage power device |
| Keyword(4) | stray inductance |
| Keyword(5) | stray capacitance |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Takashi Matsuyoshi |
| 1st Author's Affiliation | Kyushu Inst. of Technology (KIT) |
| 2nd Author's Name | Msanori Tsukuda |
| 2nd Author's Affiliation | The Int'l Center for the Study of East Asian dev./Kyushu Inst. of Technology (ICSEAD/KIT) |
| 3rd Author's Name | Hidetoshi Hirai |
| 3rd Author's Affiliation | Kyushu Inst. of Technology (KIT) |
| 4th Author's Name | Ichiro Omura |
| 4th Author's Affiliation | Kyushu Inst. of Technology (KIT) |
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| Speaker | Author-1 |
| Date Time | 2013-01-25 10:15:00 |
| Presentation Time | 25 minutes |
| Registration for | EE |
| Paper # | EE2012-46, CPM2012-168 |
| Volume (vol) | vol.112 |
| Number (no) | no.396(EE), no.397(CPM) |
| Page | pp.105-109 |
| #Pages | 5 |
| Date of Issue | 2013-01-17 (EE, CPM) |
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