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Paper Abstract and Keywords
Presentation 2013-01-25 15:25
Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms -- Anallysis of Time-Sequential Fluctuation Data (27) --
Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) Link to ES Tech. Rep. Archives: EMD2012-99
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried to use non-linear data processing in addition to usually linear one. It is shown that there are semi-stable limit cycles and bifurcation phenomenon in the time-sequential fluctuation using phase plane analysis by raw data themselves. It is indicated that there is some differences between data by rectangular input and those by sinusoidal one using phase plane analysis at neighboring lower limits of the amplitudes of the oscillation. And it is suggested that there is possible to reproduce quasi-limit cycle and quasi-bifurcation by using the combination of some of fundamental waveforms.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / minimal sliding amplitude / phase plane analysis / limit cycle / bifurcation  
Reference Info. IEICE Tech. Rep., vol. 112, no. 415, EMD2012-99, pp. 9-14, Jan. 2013.
Paper # EMD2012-99 
Date of Issue 2013-01-18 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Conference Information
Committee EMD  
Conference Date 2013-01-25 - 2013-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Hitachi, Ltd., (Totsuka, Yokohama) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2013-01-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms 
Sub Title (in English) Anallysis of Time-Sequential Fluctuation Data (27) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) minimal sliding amplitude  
Keyword(6) phase plane analysis  
Keyword(7) limit cycle  
Keyword(8) bifurcation  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Shoko Nagai  
3rd Author's Affiliation Keio University (Keio)
4th Author's Name Naoki Masuda  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Akira Ishiguro  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Kunio Yanagi  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC System Co. Ltd. (TMC)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker
Date Time 2013-01-25 15:25:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2012-99 
Volume (vol) IEICE-112 
Number (no) no.415 
Page pp.9-14 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2013-01-18 


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