IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-01-24 10:15
Operation of 1000-fold voltage multiplier using SFQ reflection at under-damped junctions
Yusuke Sato, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (UEC), Masaaki Maezawa (AIST) SCE2012-28 Link to ES Tech. Rep. Archives: SCE2012-28
Abstract (in Japanese) (See Japanese page) 
(in English) Rapid-single-flux-quantum digital-to-analogue converters (RSFQ-DACs) are now under development for ac voltage standards. Recently, we have been developing RSFQ-DACs based on frequency modulation of the SFQ pulse train, in which a voltage multiplier (VM) is required to multiply the voltage by a fixed factor. Because the amount of bias current for a conventional VM increases in proportion to its multiplication factor, we have been looking for a VM device based on a different operation principle. In this paper, we report our design of a 1000-fold VM comprising double flux quantum amplifiers (DFQAs) of which the total bias current is independent of its multiplication factor. Test circuits were fabricated using a 2.5 kA/cm2 Nb process. We confirm that the experimental results demonstrate the 1000-fold operation up to 13.2 GHz input SFQ pulse repetition frequency.
Keyword (in Japanese) (See Japanese page) 
(in English) Josephson effect / Single Flux Quantum / Superconducting integrated circuits / Under-damped junction / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 408, SCE2012-28, pp. 19-24, Jan. 2013.
Paper # SCE2012-28 
Date of Issue 2013-01-17 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2012-28 Link to ES Tech. Rep. Archives: SCE2012-28

Conference Information
Committee SCE  
Conference Date 2013-01-24 - 2013-01-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Okayama Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Superconducting sensing technologies and their applications, etc. 
Paper Information
Registration To SCE 
Conference Code 2013-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Operation of 1000-fold voltage multiplier using SFQ reflection at under-damped junctions 
Sub Title (in English)  
Keyword(1) Josephson effect  
Keyword(2) Single Flux Quantum  
Keyword(3) Superconducting integrated circuits  
Keyword(4) Under-damped junction  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yusuke Sato  
1st Author's Affiliation University of Electro-Communications (UEC)
2nd Author's Name Masataka Moriya  
2nd Author's Affiliation University of Electro-Communications (UEC)
3rd Author's Name Hiroshi Shimada  
3rd Author's Affiliation University of Electro-Communications (UEC)
4th Author's Name Yoshinao Mizugaki  
4th Author's Affiliation University of Electro-Communications (UEC)
5th Author's Name Masaaki Maezawa  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2013-01-24 10:15:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2012-28 
Volume (vol) vol.112 
Number (no) no.408 
Page pp.19-24 
#Pages
Date of Issue 2013-01-17 (SCE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan