IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-12-21 15:45
Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95 Link to ES Tech. Rep. Archives: EMD2012-95
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms (Hammering Oscillating Mechanism, Micro-Sliding Mechanism, Tapping Device etc.). In this paper, first, the authors compare cyclic metal ball drop test with hammering oscillating mechanism on the performance of acceleration and force for the hammered object, and show that the distribution of the data by the latter is much smaller than the former. Second, they propose a simple and practical protocol to estimate an effective mass, effective force and effective acceleration of the electrical devices on the PCB (printed circuit board) using hammering oscillating mechanism. Third, they discuss the degradation mechanism on electrical contacts under the influence of micro-oscillation from the effective force and the frictional force, and indicate the correlation between the former and the latter. Finally, they estimate the damping ratio and natural frequency of the system on the assumption that there is transient response characteristic with impulsive concentric load in the effective acceleration.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / frictional force / effective mass / effective force / effective acceleration  
Reference Info. IEICE Tech. Rep., vol. 112, no. 370, EMD2012-95, pp. 27-32, Dec. 2012.
Paper # EMD2012-95 
Date of Issue 2012-12-14 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2012-95 Link to ES Tech. Rep. Archives: EMD2012-95

Conference Information
Committee EMD  
Conference Date 2012-12-21 - 2012-12-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2012-12-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) A fundamental study on the performance of the hammering oscillating mechanism (26) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) frictional force  
Keyword(6) effective mass  
Keyword(7) effective force  
Keyword(8) effective acceleration  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Naoki Masuda  
4th Author's Affiliation Tokyo National College of Technology (TCT)
5th Author's Name Kunio Yanagi  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Masashi Terasaki  
7th Author's Affiliation Tokyo National College of Technology (TCT)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Nippon Institute of Technology (NIT)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2012-12-21 15:45:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2012-95 
Volume (vol) IEICE-112 
Number (no) no.370 
Page pp.27-32 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2012-12-14 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan