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| Presentation | 2012-12-18 10:55 [Invited Talk] Soft-error evaluation and mitigation technologies Taiki Uemura (Fujitsu Semiconductor Ltd.)  ICD2012-116 Link to ES Tech. Rep. Archives: ICD2012-116 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays from radioactive contaminants in IC material. The importance of soft-error increases with technology scaling in semiconductor devices. In this paper, we explain evaluation and mitigation technologies in soft-error and the importance of soft-error in high performance computing. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | soft error / single event / neutron / super computer / alpha / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 365, ICD2012-116, pp. 103-108, Dec. 2012. | |
| Paper # | ICD2012-116 | |
| Date of Issue | 2012-12-10 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2012-116 Link to ES Tech. Rep. Archives: ICD2012-116 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2012-12-17 - 2012-12-18 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Tokyo Tech Front |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2012-12-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Soft-error evaluation and mitigation technologies |
| Sub Title (in English) | |
| Keyword(1) | soft error |
| Keyword(2) | single event |
| Keyword(3) | neutron |
| Keyword(4) | super computer |
| Keyword(5) | alpha |
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| 1st Author's Name | Taiki Uemura |
| 1st Author's Affiliation | Fujitsu Semiconductor Limited (Fujitsu Semiconductor Ltd.) |
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| Speaker | Author-1 |
| Date Time | 2012-12-18 10:55:00 |
| Presentation Time | 50 minutes |
| Registration for | ICD |
| Paper # | ICD2012-116 |
| Volume (vol) | vol.112 |
| Number (no) | no.365 |
| Page | pp.103-108 |
| #Pages | 6 |
| Date of Issue | 2012-12-10 (ICD) |
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