Paper Abstract and Keywords |
Presentation |
2012-12-17 15:55
[Poster Presentation]
Analyses of Code Length Dependence of Asymmetric Code for Highly Reliable SSDs with 20-40nm NAND Flash Memories Masafumi Doi (Chuo Univ.), Shuhei Tanakamaru (Chuo Univ./Univ. of Tokyo), Ken Takeuchi (Chuo Univ.) ICD2012-95 Link to ES Tech. Rep. Archives: ICD2012-95 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Asymmetric code was proposed for highly reliable SSDs. The asymmetric code increases the population of “1”s or “0”s in programming data to reduce bit errors, and thus reliability of NAND flash memories improves. In addition, the proportion of “1”s or “0”s depends on the code length of the asymmetric code. This paper compares bit error rates due to the data retention error and the program disturb with 20-40nm NAND flash memories. As a result, the effectiveness of the asymmetric code is verified. Furthermore, bit errors of the data retention error and the program disturb is analyzed with various code length of the asymmetric code. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
solid-state-drive / NAND flash memory / asymmetric code / reliability / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 365, ICD2012-95, pp. 33-33, Dec. 2012. |
Paper # |
ICD2012-95 |
Date of Issue |
2012-12-10 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ICD2012-95 Link to ES Tech. Rep. Archives: ICD2012-95 |
Conference Information |
Committee |
ICD |
Conference Date |
2012-12-17 - 2012-12-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tokyo Tech Front |
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(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2012-12-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analyses of Code Length Dependence of Asymmetric Code for Highly Reliable SSDs with 20-40nm NAND Flash Memories |
Sub Title (in English) |
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Keyword(1) |
solid-state-drive |
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NAND flash memory |
Keyword(3) |
asymmetric code |
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reliability |
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1st Author's Name |
Masafumi Doi |
1st Author's Affiliation |
Chuo University (Chuo Univ.) |
2nd Author's Name |
Shuhei Tanakamaru |
2nd Author's Affiliation |
Chuo University/University of Tokyo (Chuo Univ./Univ. of Tokyo) |
3rd Author's Name |
Ken Takeuchi |
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Chuo University (Chuo Univ.) |
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Speaker |
Author-1 |
Date Time |
2012-12-17 15:55:00 |
Presentation Time |
120 minutes |
Registration for |
ICD |
Paper # |
ICD2012-95 |
Volume (vol) |
vol.112 |
Number (no) |
no.365 |
Page |
p.33 |
#Pages |
1 |
Date of Issue |
2012-12-10 (ICD) |