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| Presentation | 2012-12-01 14:30 Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)  EMD2012-86 Link to ES Tech. Rep. Archives: EMD2012-86 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertical direction similar to real cases and studied the influences of micro-oscillating on contacts. It is shown that the performance to measure acceleration and force by Hammering Oscillating Mechanism (HOM) is more outstanding concerning both of the stability and the distribution of data than the other method. Much simpler and more practical protocols are proposed to estimate not only acceleration but also force or mass by measuring acceleration. And it is indicated that the mechanism on impulsive load and frictional force is concerned with one of the causes of the degradation phenomenon of electrical contacts. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | electrical contact / micro-oscillation / degradation phenomenon / hammering oscillating mechanism / acceleration / force / mass / frictional force | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 332, EMD2012-86, pp. 125-131, Nov. 2012. | |
| Paper # | EMD2012-86 | |
| Date of Issue | 2012-11-23 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
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| Download PDF | EMD2012-86 Link to ES Tech. Rep. Archives: EMD2012-86 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2012-11-30 - 2012-12-01 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Chiba Institute of Technology |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | International Session IS-EMD2012 |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2012-11-EMD |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts using a hammering oscillating mechanism |
| Sub Title (in English) | A fundamental study on the performance of the oscillating mechanism (25) |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | degradation phenomenon |
| Keyword(4) | hammering oscillating mechanism |
| Keyword(5) | acceleration |
| Keyword(6) | force |
| Keyword(7) | mass |
| Keyword(8) | frictional force |
| 1st Author's Name | Shin-ichi Wada |
| 1st Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 2nd Author's Name | Keiji Koshida |
| 2nd Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 3rd Author's Name | Saindaa Norovling |
| 3rd Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 4th Author's Name | Naoki Masuda |
| 4th Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 5th Author's Name | Akira Ishiguro |
| 5th Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 6th Author's Name | Kunio Yanagi |
| 6th Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 7th Author's Name | Hiroaki Kubota |
| 7th Author's Affiliation | TMC System Co. Ltd. (TMC System) |
| 8th Author's Name | Koichiro Sawa |
| 8th Author's Affiliation | Nippon Institute of Technology (Nippon Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2012-12-01 14:30:00 |
| Presentation Time | 20 minutes |
| Registration for | EMD |
| Paper # | EMD2012-86 |
| Volume (vol) | vol.112 |
| Number (no) | no.332 |
| Page | pp.125-131 |
| #Pages | 7 |
| Date of Issue | 2012-11-23 (EMD) |
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