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Paper Abstract and Keywords
Presentation 2012-12-01 14:30
Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86 Link to ES Tech. Rep. Archives: EMD2012-86
Abstract (in Japanese) (See Japanese page) 
(in English) Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertical direction similar to real cases and studied the influences of micro-oscillating on contacts. It is shown that the performance to measure acceleration and force by Hammering Oscillating Mechanism (HOM) is more outstanding concerning both of the stability and the distribution of data than the other method. Much simpler and more practical protocols are proposed to estimate not only acceleration but also force or mass by measuring acceleration. And it is indicated that the mechanism on impulsive load and frictional force is concerned with one of the causes of the degradation phenomenon of electrical contacts.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / degradation phenomenon / hammering oscillating mechanism / acceleration / force / mass / frictional force  
Reference Info. IEICE Tech. Rep., vol. 112, no. 332, EMD2012-86, pp. 125-131, Nov. 2012.
Paper # EMD2012-86 
Date of Issue 2012-11-23 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMD  
Conference Date 2012-11-30 - 2012-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English) Chiba Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2012 
Paper Information
Registration To EMD 
Conference Code 2012-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts using a hammering oscillating mechanism 
Sub Title (in English) A fundamental study on the performance of the oscillating mechanism (25) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) degradation phenomenon  
Keyword(4) hammering oscillating mechanism  
Keyword(5) acceleration  
Keyword(6) force  
Keyword(7) mass  
Keyword(8) frictional force  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Naoki Masuda  
4th Author's Affiliation TMC System Co. Ltd. (TMC System)
5th Author's Name Akira Ishiguro  
5th Author's Affiliation TMC System Co. Ltd. (TMC System)
6th Author's Name Kunio Yanagi  
6th Author's Affiliation TMC System Co. Ltd. (TMC System)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC System Co. Ltd. (TMC System)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker
Date Time 2012-12-01 14:30:00 
Presentation Time 20 
Registration for EMD 
Paper # IEICE-EMD2012-86 
Volume (vol) IEICE-112 
Number (no) no.332 
Page pp.125-131 
#Pages IEICE-7 
Date of Issue IEICE-EMD-2012-11-23 


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