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Paper Abstract and Keywords
Presentation 2012-11-30 13:30
E-field probe calibration in a G-TEM cell
Takehiro Morioka (AIST)
Abstract (in Japanese) (See Japanese page) 
(in English) The E-field strength is ordinary evaluated by using a field probe whose correction factor is already calibrated against the standard E-field strength. Employing a gigahertz transverse electromagnetic (G-TEM) cell is a good choice to realize a compact E-field generation system in terms of cost and simplicity. However, the E-field strength of the G-TEM cell is hard to be predicted theoretically. In the present paper, the probe calibration using the standard E-field in the G-TEM cell and the thorough
uncertainty analysis are performed.
Keyword (in Japanese) (See Japanese page) 
(in English) E-field strength / field probe / G-TEM cell / Uncertainty / / / /  
Reference Info. IEICE Tech. Rep.
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Conference Information
Committee EMCJ  
Conference Date 2012-11-29 - 2012-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) NICT 
Topics (in Japanese) (See Japanese page) 
Topics (in English) 5th Pan-Pacific EMC Joint Meeting - PPEMC’12 
Paper Information
Registration To EMCJ 
Conference Code 2012-11-EMCJ 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) E-field probe calibration in a G-TEM cell 
Sub Title (in English)  
Keyword(1) E-field strength  
Keyword(2) field probe  
Keyword(3) G-TEM cell  
Keyword(4) Uncertainty  
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1st Author's Name Takehiro Morioka  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2012-11-30 13:30:00 
Presentation Time 20 minutes 
Registration for EMCJ 
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