講演抄録/キーワード |
講演名 |
2012-11-30 13:30
E-field probe calibration in a G-TEM cell ○Takehiro Morioka(AIST) |
抄録 |
(和) |
The E-field strength is ordinary evaluated by using a field probe whose correction factor is already calibrated against the standard E-field strength. Employing a gigahertz transverse electromagnetic (G-TEM) cell is a good choice to realize a compact E-field generation system in terms of cost and simplicity. However, the E-field strength of the G-TEM cell is hard to be predicted theoretically. In the present paper, the probe calibration using the standard E-field in the G-TEM cell and the thorough
uncertainty analysis are performed. |
(英) |
The E-field strength is ordinary evaluated by using a field probe whose correction factor is already calibrated against the standard E-field strength. Employing a gigahertz transverse electromagnetic (G-TEM) cell is a good choice to realize a compact E-field generation system in terms of cost and simplicity. However, the E-field strength of the G-TEM cell is hard to be predicted theoretically. In the present paper, the probe calibration using the standard E-field in the G-TEM cell and the thorough
uncertainty analysis are performed. |
キーワード |
(和) |
E-field strength / field probe / G-TEM cell / Uncertainty / / / / |
(英) |
E-field strength / field probe / G-TEM cell / Uncertainty / / / / |
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