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Paper Abstract and Keywords
Presentation 2012-11-29 14:45
Electrical characteristics of MIS-diodes with Al2O3 deposited by ALD on GaN
Yasuhiro Iwata, Toshiharu Kubo, Takashi Egawa (NITech) ED2012-73 CPM2012-130 LQE2012-101 Link to ES Tech. Rep. Archives: ED2012-73 CPM2012-130 LQE2012-101
Abstract (in Japanese) (See Japanese page) 
(in English) We focused Al2O3 as an insulator in MIS structures. MIS-diodes were fabricated with Al2O3 deposited by ALD on GaN at 200 ℃,250 ℃ and 300 ℃, and their electrical characteristics were evaluated. H2O or O3 or both of them were used as an oxygen precursor. The leakage current was suppressed by Al2O3 deposition, and the smallest threshold voltage shift was observed with the Al2O3 deposited by O3 at 300 ℃ when using H2O or O3. Further the oxide charge in Al2O3 deposited by both H2O and O3 alternately was smaller than that in Al2O3 deposited by H2O or O3.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / MIS-diodes / ALD / insulator / interface / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 327, ED2012-73, pp. 33-36, Nov. 2012.
Paper # ED2012-73 
Date of Issue 2012-11-22 (ED, CPM, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2012-73 CPM2012-130 LQE2012-101 Link to ES Tech. Rep. Archives: ED2012-73 CPM2012-130 LQE2012-101

Conference Information
Committee ED LQE CPM  
Conference Date 2012-11-29 - 2012-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka City University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Nitride and Compound Semiconductor Devices 
Paper Information
Registration To ED 
Conference Code 2012-11-ED-LQE-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Electrical characteristics of MIS-diodes with Al2O3 deposited by ALD on GaN 
Sub Title (in English)  
Keyword(1) GaN  
Keyword(2) MIS-diodes  
Keyword(3) ALD  
Keyword(4) insulator  
Keyword(5) interface  
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Keyword(7)  
Keyword(8)  
1st Author's Name Yasuhiro Iwata  
1st Author's Affiliation Nagoya Institute of Technology (NITech)
2nd Author's Name Toshiharu Kubo  
2nd Author's Affiliation Nagoya Institute of Technology (NITech)
3rd Author's Name Takashi Egawa  
3rd Author's Affiliation Nagoya Institute of Technology (NITech)
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Speaker Author-1 
Date Time 2012-11-29 14:45:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2012-73, CPM2012-130, LQE2012-101 
Volume (vol) vol.112 
Number (no) no.327(ED), no.328(CPM), no.329(LQE) 
Page pp.33-36 
#Pages
Date of Issue 2012-11-22 (ED, CPM, LQE) 


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