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| Presentation | 2012-11-28 16:00 A Method to Estimate the Number of Don't-Care Bits with Netlist Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT)  VLD2012-104 DC2012-70 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc. in addition to fault detection. If X-filling cannot achieve sufficient results, we have to go back to the DFT and generate test vectors again. In this paper, we present a method to predict effectiveness of X-filling by estimating the number of don't-care (X) bits identified in test vectors. As the results, repeating the DFT and ATPG can be avoided due to insufficient results of X-filling. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Test Generation / ATPG / Don't-Care Bit / LSI Design Flow / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 321, DC2012-70, pp. 261-266, Nov. 2012. | |
| Paper # | DC2012-70 | |
| Date of Issue | 2012-11-19 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2012-104 DC2012-70 |
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| Conference Information | |
| Committee | VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
| Conference Date | 2012-11-26 - 2012-11-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Centennial Hall Kyushu University School of Medicine |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2012 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method to Estimate the Number of Don't-Care Bits with Netlist |
| Sub Title (in English) | |
| Keyword(1) | Test Generation |
| Keyword(2) | ATPG |
| Keyword(3) | Don't-Care Bit |
| Keyword(4) | LSI Design Flow |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kohei Miyase |
| 1st Author's Affiliation | Kyushu Institute of Technology (KIT) |
| 2nd Author's Name | Seiji Kajihara |
| 2nd Author's Affiliation | Kyushu Institute of Technology (KIT) |
| 3rd Author's Name | Xiaoqing Wen |
| 3rd Author's Affiliation | Kyushu Institute of Technology (KIT) |
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| Speaker | Author-1 |
| Date Time | 2012-11-28 16:00:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | VLD2012-104, DC2012-70 |
| Volume (vol) | vol.112 |
| Number (no) | no.320(VLD), no.321(DC) |
| Page | pp.261-266 |
| #Pages | 6 |
| Date of Issue | 2012-11-19 (VLD, DC) |
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