Paper Abstract and Keywords |
Presentation |
2012-11-27 13:00
Accurate I/O Buffer Impedance Self-adjustment using Threshold Voltage and Temperature Sensors Zhi Li, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2012-79 DC2012-45 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
With the increased operating frequency and the reduction of feature
size, achieving low error-rate data transmission between LSIs is an
important field of research. In particular, input/output (I/O) impedance
matching, as one of the necessary technologies for high-speed
transmission, is strongly required. In this paper, we propose an
architecture of output buffer whose impedance is self-adjustable against
process variation and temperature characteristic of MOS transistors. The
proposed architecture utilizes on-chip sensor circuits to capture
threshold voltages and temperatures. Based on a commercial 65nm CMOS
technology, the proposed method has been verified. Without the use of
reference resistor, it successfully adjusts the I/O impedance within
2.36 % and 1.4 % around a target of 50 $\Omega$ through simulation and
measurement, respectively, regardless of the process parameters and
temperature. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Process variation / Threshold-voltage variation / Temperature sensor / Accuracy improvement / Impedance Matching / Input and output impedance / Input and output impedance / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 320, VLD2012-79, pp. 117-122, Nov. 2012. |
Paper # |
VLD2012-79 |
Date of Issue |
2012-11-19 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2012-79 DC2012-45 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2012-11-26 - 2012-11-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Centennial Hall Kyushu University School of Medicine |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2012 -New Field of VLSI Design- |
Paper Information |
Registration To |
VLD |
Conference Code |
2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Accurate I/O Buffer Impedance Self-adjustment using Threshold Voltage and Temperature Sensors |
Sub Title (in English) |
|
Keyword(1) |
Process variation |
Keyword(2) |
Threshold-voltage variation |
Keyword(3) |
Temperature sensor |
Keyword(4) |
Accuracy improvement |
Keyword(5) |
Impedance Matching |
Keyword(6) |
Input and output impedance |
Keyword(7) |
Input and output impedance |
Keyword(8) |
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1st Author's Name |
Zhi Li |
1st Author's Affiliation |
Kyoto University (Kyoto Univ.) |
2nd Author's Name |
Hiroshi Tsutsui |
2nd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
3rd Author's Name |
Hiroyuki Ochi |
3rd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
4th Author's Name |
Takashi Sato |
4th Author's Affiliation |
Kyoto University (Kyoto Univ.) |
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Speaker |
Author-1 |
Date Time |
2012-11-27 13:00:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
VLD2012-79, DC2012-45 |
Volume (vol) |
vol.112 |
Number (no) |
no.320(VLD), no.321(DC) |
Page |
pp.117-122 |
#Pages |
6 |
Date of Issue |
2012-11-19 (VLD, DC) |
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