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Paper Abstract and Keywords
Presentation 2012-11-27 13:00
Effective Orderings of Instances and Variable Assignments in SAT-based ATPG with Solution Reuse
Kenji Ueda, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2012-83 DC2012-49
Abstract (in Japanese) (See Japanese page) 
(in English) This report discusses the efficiency of iteratively solving various instances with
solution reuse in test generation based on Boolean satisfiability (SAT).
The efficiency is mainly affected by (1) instance ordering, (2) variable ordering and
(3) logic value assignments. This work presents an effective method to determine two factors of
(1) and (2). The proposed method aims at reducing the overall processing time by decreasing
the number of similarity calculation, which is needed to determine an effective instance order,
by means of a threshold value of similarity. The method also attempts to enhance the efficiency of
searching solutions by determining an variable order
with history of solution reuse in terms of literals.
In this work, preliminary experiments are conducted to find out appropriate parameters used in the proposed method.
Experimental results under the parameters show that the proposed method can outperform conventional methods.
Keyword (in Japanese) (See Japanese page) 
(in English) Test generation (ATPG) / Boolean satisfiability (SAT) / solution reuse / instance ordering / variable ordering / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 321, DC2012-49, pp. 141-146, Nov. 2012.
Paper # DC2012-49 
Date of Issue 2012-11-19 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2012-83 DC2012-49

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2012-11-26 - 2012-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Centennial Hall Kyushu University School of Medicine 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2012 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Effective Orderings of Instances and Variable Assignments in SAT-based ATPG with Solution Reuse 
Sub Title (in English)  
Keyword(1) Test generation (ATPG)  
Keyword(2) Boolean satisfiability (SAT)  
Keyword(3) solution reuse  
Keyword(4) instance ordering  
Keyword(5) variable ordering  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kenji Ueda  
1st Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
2nd Author's Name Tsuyoshi Iwagaki  
2nd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
3rd Author's Name Hideyuki Ichihara  
3rd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
4th Author's Name Tomoo Inoue  
4th Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
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Speaker Author-1 
Date Time 2012-11-27 13:00:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2012-83, DC2012-49 
Volume (vol) vol.112 
Number (no) no.320(VLD), no.321(DC) 
Page pp.141-146 
#Pages
Date of Issue 2012-11-19 (VLD, DC) 


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