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| Presentation | 2012-11-22 10:45 Discussions on Measurement Ranges in Balanced-Type Circular Disk Resonator Method to Measure Dielectric Substrates Yoshio Kobayashi (SUMTEC)  MW2012-121 Link to ES Tech. Rep. Archives: MW2012-121 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Balanced-type circular disk resonator method, excited by coaxial lines, is commonly used to measure the frequency dependence of the complex relative permittivity of dielectric substrates. In this paper, the measurement permissible ranges are discussed for frequency range, substrate thickness, relative permittivity, loss tangent, which result in the frequency range of 3~110GHz, substrate thickness of 0.05~2mm, relative permittivity of 1.1~10, and loss tangent of 0.0001~0.02. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Complex permittivity / Dielectric substrate / Frequency dependent measurement / Microwave / Millimeter-wave / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 312, MW2012-121, pp. 47-50, Nov. 2012. | |
| Paper # | MW2012-121 | |
| Date of Issue | 2012-11-14 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2012-121 Link to ES Tech. Rep. Archives: MW2012-121 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2012-11-21 - 2012-11-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Technologies |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2012-11-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Discussions on Measurement Ranges in Balanced-Type Circular Disk Resonator Method to Measure Dielectric Substrates |
| Sub Title (in English) | |
| Keyword(1) | Complex permittivity |
| Keyword(2) | Dielectric substrate |
| Keyword(3) | Frequency dependent measurement |
| Keyword(4) | Microwave |
| Keyword(5) | Millimeter-wave |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yoshio Kobayashi |
| 1st Author's Affiliation | SUMTEC, Inc. (SUMTEC) |
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| Speaker | Author-1 |
| Date Time | 2012-11-22 10:45:00 |
| Presentation Time | 30 minutes |
| Registration for | MW |
| Paper # | MW2012-121 |
| Volume (vol) | vol.112 |
| Number (no) | no.312 |
| Page | pp.47-50 |
| #Pages | 4 |
| Date of Issue | 2012-11-14 (MW) |
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