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| Presentation | 2012-11-21 14:15 How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU)  ISEC2012-57 LOIS2012-32 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been considered to be a security threat, and there is a need to develop a method to evaluate the security of cryptographic modules against the fault attack. In our research, we have developed an experiment environment for fault injection attack using electromagnetic irradiation to evaluate the security of cryptographic modules. This environment irradiates electromagnetic wave to a smartcard with software-implemented AES. We have succeeded in inducing a fault in each clock of the AddRoundKey process. As a result, we have extracted the whole 10th round key of AES by a simple operation or directly, from faulty and correct ciphertexts. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Smart Card / MPU / Fault Injection Attack / Electromagnetic Wave / AES / DFA / Cryptography / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 305, ISEC2012-57, pp. 1-8, Nov. 2012. | |
| Paper # | ISEC2012-57 | |
| Date of Issue | 2012-11-14 (ISEC, LOIS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ISEC2012-57 LOIS2012-32 |
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| Conference Information | |
| Committee | ISEC LOIS |
| Conference Date | 2012-11-21 - 2012-11-22 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Shizuoka City Industry-University Exchange Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ISEC |
| Conference Code | 2012-11-ISEC-LOIS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion |
| Sub Title (in English) | |
| Keyword(1) | Smart Card |
| Keyword(2) | MPU |
| Keyword(3) | Fault Injection Attack |
| Keyword(4) | Electromagnetic Wave |
| Keyword(5) | AES |
| Keyword(6) | DFA |
| Keyword(7) | Cryptography |
| Keyword(8) | |
| 1st Author's Name | Yuu Tsuchiya |
| 1st Author's Affiliation | Yokohama National University (YNU) |
| 2nd Author's Name | Takeshi Kishikawa |
| 2nd Author's Affiliation | Yokohama National University (YNU) |
| 3rd Author's Name | Shohei Saito |
| 3rd Author's Affiliation | Yokohama National University (YNU) |
| 4th Author's Name | Tsuyoshi Toyama |
| 4th Author's Affiliation | Yokohama National University (YNU) |
| 5th Author's Name | Akihiko Sasaki |
| 5th Author's Affiliation | MORITA TECH CO., LTD. (MORITA TECH) |
| 6th Author's Name | Akashi Satoh |
| 6th Author's Affiliation | VLSI Design and Education Center, University of Tokyo (VDEC, Univ. Tokyo) |
| 7th Author's Name | Tsutomu Matsumoto |
| 7th Author's Affiliation | Yokohama National University (YNU) |
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| Speaker | Author-1 |
| Date Time | 2012-11-21 14:15:00 |
| Presentation Time | 25 minutes |
| Registration for | ISEC |
| Paper # | ISEC2012-57, LOIS2012-32 |
| Volume (vol) | vol.112 |
| Number (no) | no.305(ISEC), no.306(LOIS) |
| Page | pp.1-8 |
| #Pages | 8 |
| Date of Issue | 2012-11-14 (ISEC, LOIS) |
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