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Paper Abstract and Keywords
Presentation 2012-10-26 13:50
Ultra high speed wet etching technology for a silicon wafer process
Takeshi Sakai, Tatsuro Yoshida, Kazuhiro Yoshikawa, Tadahiro Ohmi (Tohoku Univ.) SDM2012-97 Link to ES Tech. Rep. Archives: SDM2012-97
Abstract (in Japanese) (See Japanese page) 
(in English) The silicon wafer thinning technology is important in three-dimensional integrated technology. In this paper, we consider the silicon wafer thinning technology by Wet Etching. And, we propose new process with SOI wafer.
Keyword (in Japanese) (See Japanese page) 
(in English) Three-dimensional integrated technology / Wet etching / Silicon wafer / Thinning technology / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 263, SDM2012-97, pp. 41-45, Oct. 2012.
Paper # SDM2012-97 
Date of Issue 2012-10-18 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2012-97 Link to ES Tech. Rep. Archives: SDM2012-97

Conference Information
Committee SDM  
Conference Date 2012-10-25 - 2012-10-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. (Niche) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process science and new process technologies 
Paper Information
Registration To SDM 
Conference Code 2012-10-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Ultra high speed wet etching technology for a silicon wafer process 
Sub Title (in English)  
Keyword(1) Three-dimensional integrated technology  
Keyword(2) Wet etching  
Keyword(3) Silicon wafer  
Keyword(4) Thinning technology  
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1st Author's Name Takeshi Sakai  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Tatsuro Yoshida  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Kazuhiro Yoshikawa  
3rd Author's Affiliation Tohoku University/Apprecia Technology Inc. (Tohoku Univ.)
4th Author's Name Tadahiro Ohmi  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2012-10-26 13:50:00 
Presentation Time 25 minutes 
Registration for SDM 
Paper # SDM2012-97 
Volume (vol) vol.112 
Number (no) no.263 
Page pp.41-45 
#Pages
Date of Issue 2012-10-18 (SDM) 


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