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Paper Abstract and Keywords
Presentation 2012-10-19 15:25
A Simulation of the Extended Cumulative Exposure Model
Takenori Sakumura, Hideo Hirose (KIT) R2012-58
Abstract (in Japanese) (See Japanese page) 
(in English) The cumulative exposure model is often used to express the failure probability model in step-stress accelerated life test; the step-up procedure continues until a break down occurs. This probability model is widely accepted in reliability fields because accumulation of fatigue is considered to be reasonable. Contrary to this, the memoryless model is also used in electrical engineering because accumulation of fatigue is not observed in some cases. The extended cumulative exposure model includes features of both the described models. In this paper, we report the simulation study results based on this model.
Keyword (in Japanese) (See Japanese page) 
(in English) step-stress accelerated life test / extended cumulative exposure model / Weibul power law / / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 252, R2012-58, pp. 23-28, Oct. 2012.
Paper # R2012-58 
Date of Issue 2012-10-12 (R) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2012-10-19 - 2012-10-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Paper Information
Registration To R 
Conference Code 2012-10-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Simulation of the Extended Cumulative Exposure Model 
Sub Title (in English)  
Keyword(1) step-stress accelerated life test  
Keyword(2) extended cumulative exposure model  
Keyword(3) Weibul power law  
1st Author's Name Takenori Sakumura  
1st Author's Affiliation Kyushu Institute of Technology (KIT)
2nd Author's Name Hideo Hirose  
2nd Author's Affiliation Kyushu Institute of Technology (KIT)
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Date Time 2012-10-19 15:25:00 
Presentation Time 25 
Registration for R 
Paper # IEICE-R2012-58 
Volume (vol) IEICE-112 
Number (no) no.252 
Page pp.23-28 
#Pages IEICE-6 
Date of Issue IEICE-R-2012-10-12 

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