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Paper Abstract and Keywords
Presentation 2012-09-18 13:20
[Invited Talk] The LSI Design Methodology of Tamper Resistant Cryptographic Circuit
Takeshi Fujino, Mitsuru Shiozaki, Takaya Kubota (Ritsumeikan Univ.), Masaya Yoshikawa (Meijyo Uiv.) RECONF2012-29
Abstract (in Japanese) (See Japanese page) 
(in English) Tamper LSI Design Methodology have to be applied in order to implement secure cryptographic circuit which is resistant to side-channel attack such as DPA (Differential Power Analysis). The principle of DPA, some typical countermeasures against DPA, and the problem on the LSI implementation are introduced in this paper. The “dual-rail RSL memory” which consumes constant power irrespective of input/output value, is developed. The cryptographic design methodology, in which the “dual-rail RSL memory” is used on a non-linear circuit, and the additive masked logic using XOR gate is used on a linear circuit, is easy to be implemented on SoC, because these methods are easy to be implemented in the conventional LSI design flow. The AES cryptographic circuit, which is the most popular cryptographic algolithm, was designed in 0.18 um CMOS technology. The test chip demonstrates the high tamper resistance against power analysis.
Keyword (in Japanese) (See Japanese page) 
(in English) Tamper Resistant LSI / Side-Channel Attack / AES / DPA / CPA / WDDL / RSL / Dual-rail RSL Memory  
Reference Info. IEICE Tech. Rep., vol. 112, no. 203, RECONF2012-29, pp. 31-36, Sept. 2012.
Paper # RECONF2012-29 
Date of Issue 2012-09-11 (RECONF) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Conference Information
Committee RECONF  
Conference Date 2012-09-18 - 2012-09-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Epock Ritsumei 21, Ritsumeikan Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reconfigurable Systems, etc. 
Paper Information
Registration To RECONF 
Conference Code 2012-09-RECONF 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The LSI Design Methodology of Tamper Resistant Cryptographic Circuit 
Sub Title (in English)  
Keyword(1) Tamper Resistant LSI  
Keyword(2) Side-Channel Attack  
Keyword(3) AES  
Keyword(4) DPA  
Keyword(5) CPA  
Keyword(6) WDDL  
Keyword(7) RSL  
Keyword(8) Dual-rail RSL Memory  
1st Author's Name Takeshi Fujino  
1st Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
2nd Author's Name Mitsuru Shiozaki  
2nd Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
3rd Author's Name Takaya Kubota  
3rd Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
4th Author's Name Masaya Yoshikawa  
4th Author's Affiliation Meijyo University (Meijyo Uiv.)
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Speaker Author-1 
Date Time 2012-09-18 13:20:00 
Presentation Time 50 minutes 
Registration for RECONF 
Paper # RECONF2012-29 
Volume (vol) vol.112 
Number (no) no.203 
Page pp.31-36 
#Pages
Date of Issue 2012-09-11 (RECONF) 


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