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Paper Abstract and Keywords
Presentation 2012-08-23 10:25
Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic
Kohei Kawakami, Shinya Maehara, Kohei Doi, Hideaki Arai, Takanobu Kondo, Naoya Shimizu, Takashi Sato, Shuichi Sakamoto, Yasuo Ohdaira, Masashi Ohkawa (Niigata Univ.) R2012-22 EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26 Link to ES Tech. Rep. Archives: EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26
Abstract (in Japanese) (See Japanese page) 
(in English) The pseudo-random number is normally used for large-scale simulation and encryption of communication. On the other hand, the physical-random number is recently expected to be used in these fields because it has no calculable periodicity and so makes the safer cipher. Therefore, many fast physical-random number generations, which use the wide intensity noise characteristic of a diode laser, have been reported. Because the diode laser has very fast frequency noise, we propose the method using it here.
Keyword (in Japanese) (See Japanese page) 
(in English) Laser diode / Physical-random number / Frequency noise / Cryptographic application / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 184, LQE2012-26, pp. 9-12, Aug. 2012.
Paper # LQE2012-26 
Date of Issue 2012-08-16 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2012-22 EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26 Link to ES Tech. Rep. Archives: EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26

Conference Information
Committee LQE CPM EMD OPE R  
Conference Date 2012-08-23 - 2012-08-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To LQE 
Conference Code 2012-08-LQE-CPM-EMD-OPE-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic 
Sub Title (in English)  
Keyword(1) Laser diode  
Keyword(2) Physical-random number  
Keyword(3) Frequency noise  
Keyword(4) Cryptographic application  
Keyword(5)  
Keyword(6)  
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Keyword(8)  
1st Author's Name Kohei Kawakami  
1st Author's Affiliation Niigata University (Niigata Univ.)
2nd Author's Name Shinya Maehara  
2nd Author's Affiliation Niigata University (Niigata Univ.)
3rd Author's Name Kohei Doi  
3rd Author's Affiliation Niigata University (Niigata Univ.)
4th Author's Name Hideaki Arai  
4th Author's Affiliation Niigata University (Niigata Univ.)
5th Author's Name Takanobu Kondo  
5th Author's Affiliation Niigata University (Niigata Univ.)
6th Author's Name Naoya Shimizu  
6th Author's Affiliation Niigata University (Niigata Univ.)
7th Author's Name Takashi Sato  
7th Author's Affiliation Niigata University (Niigata Univ.)
8th Author's Name Shuichi Sakamoto  
8th Author's Affiliation Niigata University (Niigata Univ.)
9th Author's Name Yasuo Ohdaira  
9th Author's Affiliation Niigata University (Niigata Univ.)
10th Author's Name Masashi Ohkawa  
10th Author's Affiliation Niigata University (Niigata Univ.)
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Speaker Author-1 
Date Time 2012-08-23 10:25:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # R2012-22, EMD2012-28, CPM2012-53, OPE2012-60, LQE2012-26 
Volume (vol) vol.112 
Number (no) no.180(R), no.181(EMD), no.182(CPM), no.183(OPE), no.184(LQE) 
Page pp.9-12 
#Pages
Date of Issue 2012-08-16 (R, EMD, CPM, OPE, LQE) 


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