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Paper Abstract and Keywords
Presentation 2012-06-29 10:45
[Invited Talk] Decomposition analysis of on-current variability of FinFETs
Takashi Matsukawa, Yongxun Liu, Kazuhiko Endo, Shinichi O'uchi, Meishoku Masahara (AIST)
Abstract (in Japanese) (See Japanese page) 
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Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee SDM ED  
Conference Date 2012-06-27 - 2012-06-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Seinen-kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) 2012 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices 
Paper Information
Registration To SDM 
Conference Code 2012-06-SDM-ED 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Decomposition analysis of on-current variability of FinFETs 
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1st Author's Name Takashi Matsukawa  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Yongxun Liu  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Kazuhiko Endo  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Shinichi O'uchi  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Meishoku Masahara  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker
Date Time 2012-06-29 10:45:00 
Presentation Time 30 
Registration for SDM 
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