IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-06-22 17:25
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39 Link to ES Tech. Rep. Archives: EMD2012-15 CPM2012-32 OME2012-39
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms. In this paper, the authors discuss an impact acceleration and force transferred to an object, which are important and fundamental elements of the hammering oscillating mechanism. They compare the performance of an improved cyclic steel cylinder drop test and that of hammering oscillating mechanism (HOM). As a result of the comparison they obtain that there less distributions of the measurement values by HOM than those of values by the improved cyclic steel cylinder drop test. Moreover by the HOM they measured the acceleration distributions in the various points of printed circuit board. Because they estimated the converted masses of the objects by using the difference of the mass of acceleration pick-ups, they obtained that the masses were different from each other and they illustrated correlative relationship between contact frictional force and the location on the printed circuit board.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / contact frictional force / acceleration distribution / converted mass /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 95, EMD2012-15, pp. 41-46, June 2012.
Paper # EMD2012-15 
Date of Issue 2012-06-15 (EMD, CPM, OME) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2012-15 CPM2012-32 OME2012-39 Link to ES Tech. Rep. Archives: EMD2012-15 CPM2012-32 OME2012-39

Conference Information
Committee EMD CPM OME  
Conference Date 2012-06-22 - 2012-06-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Summer meeting for materials and devices 
Paper Information
Registration To EMD 
Conference Code 2012-06-EMD-CPM-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) A fundamental study on the performance of the oscillating mechanism(22) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) hammering oscillating mechanism  
Keyword(5) contact frictional force  
Keyword(6) acceleration distribution  
Keyword(7) converted mass  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Saindaa Norovling  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Naoki Masuda  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Akira Ishiguro  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Kunio Yanagi  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Hiroaki Kubota  
7th Author's Affiliation TMC System Co. Ltd. (TMC)
8th Author's Name Koichiro Sawa  
8th Author's Affiliation Nippon Institute of Technology (NIT)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2012-06-22 17:25:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2012-15,IEICE-CPM2012-32,IEICE-OME2012-39 
Volume (vol) IEICE-112 
Number (no) no.95(EMD), no.96(CPM), no.97(OME) 
Page pp.41-46 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2012-06-15,IEICE-CPM-2012-06-15,IEICE-OME-2012-06-15 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan