IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-05-30 15:45
High-level Design Debugging Using Potential Dependence
Shohei Ono, Takeshi Matsumoto, Masahiro Fujita (Univ. of Tokyo) VLD2012-4
Abstract (in Japanese) (See Japanese page) 
(in English) As high-level design draws more attention and has been adopted more widely, verification and debugging for high- level designs has become more important. In this paper, we propose a method to find possible correc- tions for given counterexamples, targeting high-level design descriptions. To efficiently find corrections, program slicing technique and constraints generated from counterexamples are applied to reduce the number of initial bug candidates and debugging scope. Through the experiments, we show that the proposed method with the reduction efficiently works for several example designs and bugs, and successfully identifies bug locations and bug fixes.
Keyword (in Japanese) (See Japanese page) 
(in English) bug localization / program slicing / high-level design / / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 71, VLD2012-4, pp. 19-24, May 2012.
Paper # VLD2012-4 
Date of Issue 2012-05-23 (VLD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2012-4

Conference Information
Committee IPSJ-SLDM VLD  
Conference Date 2012-05-30 - 2012-05-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitakyushu International Conference Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) System Design, etc. 
Paper Information
Registration To VLD 
Conference Code 2012-05-SLDM-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High-level Design Debugging Using Potential Dependence 
Sub Title (in English)  
Keyword(1) bug localization  
Keyword(2) program slicing  
Keyword(3) high-level design  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shohei Ono  
1st Author's Affiliation The University of Tokyo (Univ. of Tokyo)
2nd Author's Name Takeshi Matsumoto  
2nd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
3rd Author's Name Masahiro Fujita  
3rd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2012-05-30 15:45:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2012-4 
Volume (vol) IEICE-112 
Number (no) no.71 
Page pp.19-24 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2012-05-23 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan