Paper Abstract and Keywords |
Presentation |
2012-05-29 10:30
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance (2) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) NLP2012-35 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried to use non-linear data processing in addition to usually linear one. It is shown that smoothed time-sequential data is adapted to the logistic model and the data is adapted to a modified logistic model with a periodic element without smoothing very much. The data is fitted to the model by introducing a time-delay element to them. And it is shown that there are semi-stable limit cycles and bifurcation phenomenon in the time-sequential fluctuation using raw data themselves. It is suggested that there is non-linear phenomenon is caused by static friction and Coulomb’s one when external force vibrates the system. It is, however, not yet clear what element is major and what element is minor though it was clear that there are some non-linear elements. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / time-sequential data / logistic curve / limit cycle / bifurcation |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 69, NLP2012-35, pp. 49-54, May 2012. |
Paper # |
NLP2012-35 |
Date of Issue |
2012-05-21 (NLP) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
NLP2012-35 |
Conference Information |
Committee |
NLP |
Conference Date |
2012-05-28 - 2012-05-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Akita City Exchange Plaza |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
General |
Paper Information |
Registration To |
NLP |
Conference Code |
2012-05-NLP |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms |
Sub Title (in English) |
Modeling about Fluctuation of Contact Resistance (2) |
Keyword(1) |
electrical contact |
Keyword(2) |
micro-oscillation |
Keyword(3) |
contact resistance |
Keyword(4) |
micro-sliding mechanism |
Keyword(5) |
time-sequential data |
Keyword(6) |
logistic curve |
Keyword(7) |
limit cycle |
Keyword(8) |
bifurcation |
1st Author's Name |
Shin-ichi Wada |
1st Author's Affiliation |
TMC System Co. Ltd. (TMC) |
2nd Author's Name |
Keiji Koshida |
2nd Author's Affiliation |
TMC System Co. Ltd. (TMC) |
3rd Author's Name |
Hiroaki Kubota |
3rd Author's Affiliation |
TMC System Co. Ltd. (TMC) |
4th Author's Name |
Koichiro Sawa |
4th Author's Affiliation |
Nippon Institute of Technology (NIT) |
5th Author's Name |
|
5th Author's Affiliation |
() |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2012-05-29 10:30:00 |
Presentation Time |
25 minutes |
Registration for |
NLP |
Paper # |
NLP2012-35 |
Volume (vol) |
vol.112 |
Number (no) |
no.69 |
Page |
pp.49-54 |
#Pages |
6 |
Date of Issue |
2012-05-21 (NLP) |