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Paper Abstract and Keywords
Presentation 2012-05-29 10:30
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (2) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) NLP2012-35
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried to use non-linear data processing in addition to usually linear one. It is shown that smoothed time-sequential data is adapted to the logistic model and the data is adapted to a modified logistic model with a periodic element without smoothing very much. The data is fitted to the model by introducing a time-delay element to them. And it is shown that there are semi-stable limit cycles and bifurcation phenomenon in the time-sequential fluctuation using raw data themselves. It is suggested that there is non-linear phenomenon is caused by static friction and Coulomb’s one when external force vibrates the system. It is, however, not yet clear what element is major and what element is minor though it was clear that there are some non-linear elements.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / time-sequential data / logistic curve / limit cycle / bifurcation  
Reference Info. IEICE Tech. Rep., vol. 112, no. 69, NLP2012-35, pp. 49-54, May 2012.
Paper # NLP2012-35 
Date of Issue 2012-05-21 (NLP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Conference Information
Committee NLP  
Conference Date 2012-05-28 - 2012-05-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita City Exchange Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To NLP 
Conference Code 2012-05-NLP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms 
Sub Title (in English) Modeling about Fluctuation of Contact Resistance (2) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) time-sequential data  
Keyword(6) logistic curve  
Keyword(7) limit cycle  
Keyword(8) bifurcation  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Hiroaki Kubota  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Koichiro Sawa  
4th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2012-05-29 10:30:00 
Presentation Time 25 minutes 
Registration for NLP 
Paper # NLP2012-35 
Volume (vol) vol.112 
Number (no) no.69 
Page pp.49-54 
#Pages
Date of Issue 2012-05-21 (NLP) 


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