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| Presentation | 2012-04-24 11:15 [Invited Talk] Write-/Read- Disturb Issues and Circuit Solutions Yuichiro Ishii, Yasumasa Tsukamoto, Koji Nii, Hidehiro Fujiwara, Makoto Yabuuchi, Koji Tanaka, Shinji Tanaka, Yasuhisa Shimazaki (Renesas Electronics)  ICD2012-11 Link to ES Tech. Rep. Archives: ICD2012-11 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | This paper describes some circuit techniques for an 8T dual-port (DP) SRAM to improve its minimum operating voltage against write-/read-disturb issues and a new test screening circuit with synchronous clock to detect the worst Vmin in asynchronous clock operation. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | dual-port / Embedded SRAM / 8T / 28nm / write disturb / read disturb / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 15, ICD2012-11, pp. 55-60, April 2012. | |
| Paper # | ICD2012-11 | |
| Date of Issue | 2012-04-16 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2012-11 Link to ES Tech. Rep. Archives: ICD2012-11 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2012-04-23 - 2012-04-24 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Seion-so, Tsunagi Hot Spring (Iwate) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Memory Device Technologies |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2012-04-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Write-/Read- Disturb Issues and Circuit Solutions |
| Sub Title (in English) | |
| Keyword(1) | dual-port |
| Keyword(2) | Embedded SRAM |
| Keyword(3) | 8T |
| Keyword(4) | 28nm |
| Keyword(5) | write disturb |
| Keyword(6) | read disturb |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yuichiro Ishii |
| 1st Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 2nd Author's Name | Yasumasa Tsukamoto |
| 2nd Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 3rd Author's Name | Koji Nii |
| 3rd Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 4th Author's Name | Hidehiro Fujiwara |
| 4th Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 5th Author's Name | Makoto Yabuuchi |
| 5th Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 6th Author's Name | Koji Tanaka |
| 6th Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 7th Author's Name | Shinji Tanaka |
| 7th Author's Affiliation | Renesas Electronics (Renesas Electronics) |
| 8th Author's Name | Yasuhisa Shimazaki |
| 8th Author's Affiliation | Renesas Electronics (Renesas Electronics) |
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| Speaker | Author-1 |
| Date Time | 2012-04-24 11:15:00 |
| Presentation Time | 50 minutes |
| Registration for | ICD |
| Paper # | ICD2012-11 |
| Volume (vol) | vol.112 |
| Number (no) | no.15 |
| Page | pp.55-60 |
| #Pages | 6 |
| Date of Issue | 2012-04-16 (ICD) |
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