Paper Abstract and Keywords |
Presentation |
2012-02-13 14:00
A new problem at Boundary-Scan testing
-- an internal disruption within IC during interconnect testing -- Shuichi Kameyama (Fujitsu & Ehime Univ.), Masayuki Baba (Fujitsu), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2011-81 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The miniaturization of electronic products is causing printed circuit boards to progress in the direction of higher density, using, for example, BGA (Ball Grid Array) devices. In this situation, Boundary-scan Test technology is increasingly more important, since it is the best way to detect manufacturing defects easily on the dense boards. This paper describes a side-effect caused by an internal disruption within an IC during the Boundary-Scan test, and also describes the root-cause and the measures for it on the basis of our experience. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Boundary-scan / test / internal circuit / interconnect testing / Lobotomy problem / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 435, DC2011-81, pp. 31-35, Feb. 2012. |
Paper # |
DC2011-81 |
Date of Issue |
2012-02-06 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2011-81 |
Conference Information |
Committee |
DC |
Conference Date |
2012-02-13 - 2012-02-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2012-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A new problem at Boundary-Scan testing |
Sub Title (in English) |
an internal disruption within IC during interconnect testing |
Keyword(1) |
Boundary-scan |
Keyword(2) |
test |
Keyword(3) |
internal circuit |
Keyword(4) |
interconnect testing |
Keyword(5) |
Lobotomy problem |
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1st Author's Name |
Shuichi Kameyama |
1st Author's Affiliation |
Fujitsu Limited & Ehime University (Fujitsu & Ehime Univ.) |
2nd Author's Name |
Masayuki Baba |
2nd Author's Affiliation |
Fujitsu Limited (Fujitsu) |
3rd Author's Name |
Yoshinobu Higami |
3rd Author's Affiliation |
Ehime University (Ehime Univ.) |
4th Author's Name |
Hiroshi Takahashi |
4th Author's Affiliation |
Ehime University (Ehime Univ.) |
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Speaker |
Author-1 |
Date Time |
2012-02-13 14:00:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2011-81 |
Volume (vol) |
vol.111 |
Number (no) |
no.435 |
Page |
pp.31-35 |
#Pages |
5 |
Date of Issue |
2012-02-06 (DC) |
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