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| Presentation | 2012-01-27 09:05 Current distribution analysis by FDTD method for measurement circuit of kit-module above 1GHz Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC-E)  EMCJ2011-111 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The method of evaluating disturbances from the kit-modules, such as a ha rd disk and a memory, has been proposed and is carried out by VCCI. In t his method, the disturbance level is evaluated by a disturbance current on power supply line. In recent years, the processing speed of electrica l equipment is increasing and the disturbances above 1 GHz appears on po wer supply line. Therefore, we should develop the method of evaluating d isturbance for the kit-modules above 1 GHz. The disturbance level of the kit-modules is evaluated by using the test board which is constructed w ith the micro strip line decoupled by chip capacitor. In frequency range of above 1 GHz, the disturbance level on the line changes by the influe nce of the standing wave. The maximum level should be obtained by the cu rrent level on many points of the line in order to reduce the influence. In addition, the effect of chip capacitors should be confirmed. In this report, the current distribution on the test board is calculate d by using the FDTD method and it is evaluated by the measurement result . As a result, when the measurement is carried out at the nearest positi on of the chip capacitor, the deviation from the maximum level is within 1 dB. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | VCCI / Kit-module / FDTD method / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 420, EMCJ2011-111, pp. 1-6, Jan. 2012. | |
| Paper # | EMCJ2011-111 | |
| Date of Issue | 2012-01-20 (EMCJ) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2011-111 |
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| Conference Information | |
| Committee | EMCJ |
| Conference Date | 2012-01-27 - 2012-01-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyushu Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Communication, EMC, etc. |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2012-01-EMCJ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Current distribution analysis by FDTD method for measurement circuit of kit-module above 1GHz |
| Sub Title (in English) | |
| Keyword(1) | VCCI |
| Keyword(2) | Kit-module |
| Keyword(3) | FDTD method |
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| 1st Author's Name | Yoshihiko Abe |
| 1st Author's Affiliation | Kyusyu Institute of Technology (KIT) |
| 2nd Author's Name | Nobuo Kuwabara |
| 2nd Author's Affiliation | Kyusyu Institute of Technology (KIT) |
| 3rd Author's Name | Hidenori Muramatsu |
| 3rd Author's Affiliation | VCCI Council (VCCI) |
| 4th Author's Name | Toshiki Shimasaki |
| 4th Author's Affiliation | NEC Engineering (NEC-E) |
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| Speaker | Author-1 |
| Date Time | 2012-01-27 09:05:00 |
| Presentation Time | 20 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2011-111 |
| Volume (vol) | vol.111 |
| Number (no) | no.420 |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2012-01-20 (EMCJ) |
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