Paper Abstract and Keywords |
Presentation |
2012-01-26 09:00
Storage capacity of the associative memory model with the zero-order synaptic decay Ryota Miyata (Tokyo Tech.), Jun Tsuzurugi (Okayama Univ. Sci.), Toru Aonishi (Tokyo Tech.), Koji Kurata (Univ. Ryukyu.) NC2011-97 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
It has been reported that synaptogenesis, formation of synaptic connection, continues to take place in certain regions of the postnatal brain including the hippocampal regions. According to the previous neurophysiological experiment, synapses with smaller strength tend to be eliminated with higher probability.
We investigate the effect of synaptogenesis on memories in the neural circuit, proposing the abstract neural network model, the Hopfield model with the zero-order synaptic decay. Using the numerical simulations, we demonstrate the possibility that synaptogenesis plays a role in maintaining recent memories embedded in the network while avoiding overloading. We also show the storage capacity of the zero-order decay model as a function of the decay rate which corresponds to the number of replacement synapses.
Furthermore, we extend the zero-order decay model to β-th-order, and investigate its characteristics varying the order of the decay term, $\beta$.
The results show that the characteristics of the β-th-order decay model are constant for a large order β. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
synaptogenesis / zero-order synaptic decay / associative memory / Hopfield model / forgetting process / β-th-order synaptic decay / overloading / storage capacity |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 419, NC2011-97, pp. 1-6, Jan. 2012. |
Paper # |
NC2011-97 |
Date of Issue |
2012-01-19 (NC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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NC2011-97 |
Conference Information |
Committee |
NC |
Conference Date |
2012-01-26 - 2012-01-27 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Future University Hakodate |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
General, Complex Systems and Neurocomputing |
Paper Information |
Registration To |
NC |
Conference Code |
2012-01-NC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Storage capacity of the associative memory model with the zero-order synaptic decay |
Sub Title (in English) |
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Keyword(1) |
synaptogenesis |
Keyword(2) |
zero-order synaptic decay |
Keyword(3) |
associative memory |
Keyword(4) |
Hopfield model |
Keyword(5) |
forgetting process |
Keyword(6) |
β-th-order synaptic decay |
Keyword(7) |
overloading |
Keyword(8) |
storage capacity |
1st Author's Name |
Ryota Miyata |
1st Author's Affiliation |
Tokyo Institute of Technology (Tokyo Tech.) |
2nd Author's Name |
Jun Tsuzurugi |
2nd Author's Affiliation |
Okayama University of Science (Okayama Univ. Sci.) |
3rd Author's Name |
Toru Aonishi |
3rd Author's Affiliation |
Tokyo Institute of Technology (Tokyo Tech.) |
4th Author's Name |
Koji Kurata |
4th Author's Affiliation |
University of the Ryukyus (Univ. Ryukyu.) |
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Speaker |
Author-1 |
Date Time |
2012-01-26 09:00:00 |
Presentation Time |
25 minutes |
Registration for |
NC |
Paper # |
NC2011-97 |
Volume (vol) |
vol.111 |
Number (no) |
no.419 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2012-01-19 (NC) |
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