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Paper Abstract and Keywords
Presentation 2012-01-26 09:00
Storage capacity of the associative memory model with the zero-order synaptic decay
Ryota Miyata (Tokyo Tech.), Jun Tsuzurugi (Okayama Univ. Sci.), Toru Aonishi (Tokyo Tech.), Koji Kurata (Univ. Ryukyu.) NC2011-97
Abstract (in Japanese) (See Japanese page) 
(in English) It has been reported that synaptogenesis, formation of synaptic connection, continues to take place in certain regions of the postnatal brain including the hippocampal regions. According to the previous neurophysiological experiment, synapses with smaller strength tend to be eliminated with higher probability.
We investigate the effect of synaptogenesis on memories in the neural circuit, proposing the abstract neural network model, the Hopfield model with the zero-order synaptic decay. Using the numerical simulations, we demonstrate the possibility that synaptogenesis plays a role in maintaining recent memories embedded in the network while avoiding overloading. We also show the storage capacity of the zero-order decay model as a function of the decay rate which corresponds to the number of replacement synapses.
Furthermore, we extend the zero-order decay model to β-th-order, and investigate its characteristics varying the order of the decay term, $\beta$.
The results show that the characteristics of the β-th-order decay model are constant for a large order β.
Keyword (in Japanese) (See Japanese page) 
(in English) synaptogenesis / zero-order synaptic decay / associative memory / Hopfield model / forgetting process / β-th-order synaptic decay / overloading / storage capacity  
Reference Info. IEICE Tech. Rep., vol. 111, no. 419, NC2011-97, pp. 1-6, Jan. 2012.
Paper # NC2011-97 
Date of Issue 2012-01-19 (NC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee NC  
Conference Date 2012-01-26 - 2012-01-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Future University Hakodate 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General, Complex Systems and Neurocomputing 
Paper Information
Registration To NC 
Conference Code 2012-01-NC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Storage capacity of the associative memory model with the zero-order synaptic decay 
Sub Title (in English)  
Keyword(1) synaptogenesis  
Keyword(2) zero-order synaptic decay  
Keyword(3) associative memory  
Keyword(4) Hopfield model  
Keyword(5) forgetting process  
Keyword(6) β-th-order synaptic decay  
Keyword(7) overloading  
Keyword(8) storage capacity  
1st Author's Name Ryota Miyata  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
2nd Author's Name Jun Tsuzurugi  
2nd Author's Affiliation Okayama University of Science (Okayama Univ. Sci.)
3rd Author's Name Toru Aonishi  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
4th Author's Name Koji Kurata  
4th Author's Affiliation University of the Ryukyus (Univ. Ryukyu.)
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Speaker Author-1 
Date Time 2012-01-26 09:00:00 
Presentation Time 25 minutes 
Registration for NC 
Paper # NC2011-97 
Volume (vol) vol.111 
Number (no) no.419 
Page pp.1-6 
#Pages
Date of Issue 2012-01-19 (NC) 


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