IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2012-01-26 10:30
Development of non-destructive evaluation system using an HTS-SQUID gradiometer for magnetized materials
Joji Kawano, Akira Tsukamoto, Seiji Adachi, Yasuo Oshikubo, Tsunehiro Hato, Keiichi Tanabe (SRL) SCE2011-19 Link to ES Tech. Rep. Archives: SCE2011-19
Abstract (in Japanese) (See Japanese page) 
(in English) Superconducting Quantum Interference Device (SQUID) sensor is one of the most sensitive magnetometers. Moreover, since SQUID has high magnetic sensitivity even at low frequencies, eddy-current non-destructive evaluation (NDE) using a SQUID sensor is expected to be applied to detection of deep-lying defects in conductive materials. However, in our conventional SQUID-NDE system, the SQUID sensor could not work correctly, when conductive materials have surface magnetization larger than 0.1 mT. In the present study, we have developed a new eddy-current non-destructive evaluation system using an HTS SQUID gradiometer with an external Cu pickup coil. By employing the external pickup coil method, the SQUID sensor can be set away from magnetized material and set inside a magnetic shield made of an HTS material. It makes possible to operate the SQUID correctly and to observe defect-induced magnetic signals from conductive materials with surface magnetization up to 10 mT, although applicable bandwidth will be narrower due to the existence of normal conductivity. This result indicates the new SQUID-NDE system can detect defects located in the ferromagnetic materials that ever seem difficult to be observed.
Keyword (in Japanese) (See Japanese page) 
(in English) Josephson junction / SQUID / Non-Destructive Evaluation / Magnetized material / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 418, SCE2011-19, pp. 1-6, Jan. 2012.
Paper # SCE2011-19 
Date of Issue 2012-01-19 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2011-19 Link to ES Tech. Rep. Archives: SCE2011-19

Conference Information
Committee SCE  
Conference Date 2012-01-26 - 2012-01-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. B3-2 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Superconducting sensing technologies and their applications, etc. 
Paper Information
Registration To SCE 
Conference Code 2012-01-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of non-destructive evaluation system using an HTS-SQUID gradiometer for magnetized materials 
Sub Title (in English)  
Keyword(1) Josephson junction  
Keyword(2) SQUID  
Keyword(3) Non-Destructive Evaluation  
Keyword(4) Magnetized material  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Joji Kawano  
1st Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
2nd Author's Name Akira Tsukamoto  
2nd Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
3rd Author's Name Seiji Adachi  
3rd Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
4th Author's Name Yasuo Oshikubo  
4th Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
5th Author's Name Tsunehiro Hato  
5th Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
6th Author's Name Keiichi Tanabe  
6th Author's Affiliation Superconductivity Reaserch Laboratory (SRL)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2012-01-26 10:30:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2011-19 
Volume (vol) vol.111 
Number (no) no.418 
Page pp.1-6 
#Pages
Date of Issue 2012-01-19 (SCE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan