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Paper Abstract and Keywords
Presentation 2012-01-20 10:30
Associativity-Variable Cache to Adaptively Expand Operating Voltage Margin
Jinwook Jung, Yohei Nakata, Shunsuke Okumura, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (JST) ICD2011-139 Link to ES Tech. Rep. Archives: ICD2011-139
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a dependable cache memory for which associativity can be reconfigured dynamically. The proposed associativity-reconfigurable cache consists of pairs of cache ways. The proposed cache can dynamically enhance its reliability in the dependable mode, thereby trading off its performance. The reliability of the proposed cache can be scaled by reconfiguring its associativity. Moreover, the configuration can be chosen based upon current operating conditions. Our chip measurement results show that the proposed dependable cache possesses the scalable characteristic of reliability. Moreover, it can decrease the minimum operating voltage by 115 mV. The cycle accurate simulation shows that designing the L1, L2 caches using the proposed scheme results in 4.93% IPC loss on average. Area estimation results show that the proposed cache adds area overhead of 1.91% and 5.57% in 32-KB and 256-KB caches, respectively.
Keyword (in Japanese) (See Japanese page) 
(in English) Cache / SRAM / Reliability / Variable Associativity / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 388, ICD2011-139, pp. 55-60, Jan. 2012.
Paper # ICD2011-139 
Date of Issue 2012-01-12 (ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2011-139 Link to ES Tech. Rep. Archives: ICD2011-139

Conference Information
Committee ICD IPSJ-ARC  
Conference Date 2012-01-19 - 2012-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Paper Information
Registration To ICD 
Conference Code 2012-01-ICD-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Associativity-Variable Cache to Adaptively Expand Operating Voltage Margin 
Sub Title (in English)  
Keyword(1) Cache  
Keyword(2) SRAM  
Keyword(3) Reliability  
Keyword(4) Variable Associativity  
1st Author's Name Jinwook Jung  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Yohei Nakata  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Shunsuke Okumura  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Hiroshi Kawaguchi  
4th Author's Affiliation Kobe University (Kobe Univ.)
5th Author's Name Masahiko Yoshimoto  
5th Author's Affiliation JST (JST)
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Date Time 2012-01-20 10:30:00 
Presentation Time 30 
Registration for ICD 
Paper # IEICE-ICD2011-139 
Volume (vol) IEICE-111 
Number (no) no.388 
Page pp.55-60 
#Pages IEICE-6 
Date of Issue IEICE-ICD-2012-01-12 

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