IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-12-16 13:55
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108 Link to ES Tech. Rep. Archives: EMD2011-108
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, the authors discussed the difference of time-sequential fluctuations in the contact resistance when contact frictional force between male-pins and female-pins were “usual”, “smaller” or their “middle”, using hammering oscillating mechanism. It was shown that the contact resistance was increasing and fluctuating under the “middle” friction. In comparison to micro-sliding mechanism, it was indicated that the difference of the contact frictional force was related to degradation phenomenon of electrical contacts and there was relative displacement between male-pins and female-pins by oscillations using hammering oscillating mechanism with 150G.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / hammering oscillating mechanism / contact frictional force / relative displacement /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 356, EMD2011-108, pp. 11-16, Dec. 2011.
Paper # EMD2011-108 
Date of Issue 2011-12-09 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-108 Link to ES Tech. Rep. Archives: EMD2011-108

Conference Information
Committee EMD  
Conference Date 2011-12-16 - 2011-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English) NIT Kanda Camps 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Electromechanical Devices 
Paper Information
Registration To EMD 
Conference Code 2011-12-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) Contact Resistance and its model (19) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) hammering oscillating mechanism  
Keyword(6) contact frictional force  
Keyword(7) relative displacement  
Keyword(8)  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Saindaa Norovling  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Keiji Koshida  
3rd Author's Affiliation TMC System Co. Ltd. (TMC)
4th Author's Name Masahiro Kawanobe  
4th Author's Affiliation TMC System Co. Ltd. (TMC)
5th Author's Name Naoki Masuda  
5th Author's Affiliation TMC System Co. Ltd. (TMC)
6th Author's Name Hiroaki Kubota  
6th Author's Affiliation TMC System Co. Ltd. (TMC)
7th Author's Name Koichiro Sawa  
7th Author's Affiliation Nippon Institute of Technology (NIT)
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2011-12-16 13:55:00 
Presentation Time 25 
Registration for EMD 
Paper # IEICE-EMD2011-108 
Volume (vol) IEICE-111 
Number (no) no.356 
Page pp.11-16 
#Pages IEICE-6 
Date of Issue IEICE-EMD-2011-12-09 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan