Paper Abstract and Keywords |
Presentation |
2011-12-15 16:10
[Poster Presentation]
A Study on High Resolution SAR ADC Toyoki Asazawa, Yoshihiro Tsunokawa, Masaya Miyahara, Akira Matsuzawa (Titech) ICD2011-122 Link to ES Tech. Rep. Archives: ICD2011-122 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This poster reports two linearity calibration methods for successive approximation register analog-to-digital converter (SAR ADC).
The linearity of SAR ADC deteriorates due to the parasitic capacitance and the mismatch of Capacitor DAC(CDAC).
The structure of CDAC with capacitor for sub DAC for mismatch calibration and parasitic capacitance calibration is proposed.
And Metal-Oxide-Metal(MOM) capacitor structure is introduced for small capacitor.
The simulation results show that calibration method for parasitic capacitance and mismatch achieved ENOB improvement from 10.6 bits to 11.8 bits. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
SAR ADC / parasitic capacitance calibration / mismatch calibration / MOM capacitor / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 352, ICD2011-122, pp. 109-109, Dec. 2011. |
Paper # |
ICD2011-122 |
Date of Issue |
2011-12-08 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2011-122 Link to ES Tech. Rep. Archives: ICD2011-122 |
Conference Information |
Committee |
ICD |
Conference Date |
2011-12-15 - 2011-12-16 |
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(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2011-12-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Study on High Resolution SAR ADC |
Sub Title (in English) |
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Keyword(1) |
SAR ADC |
Keyword(2) |
parasitic capacitance calibration |
Keyword(3) |
mismatch calibration |
Keyword(4) |
MOM capacitor |
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1st Author's Name |
Toyoki Asazawa |
1st Author's Affiliation |
Tokyo Institute of Technology (Titech) |
2nd Author's Name |
Yoshihiro Tsunokawa |
2nd Author's Affiliation |
Tokyo Institute of Technology (Titech) |
3rd Author's Name |
Masaya Miyahara |
3rd Author's Affiliation |
Tokyo Institute of Technology (Titech) |
4th Author's Name |
Akira Matsuzawa |
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Tokyo Institute of Technology (Titech) |
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Speaker |
Author-1 |
Date Time |
2011-12-15 16:10:00 |
Presentation Time |
110 minutes |
Registration for |
ICD |
Paper # |
ICD2011-122 |
Volume (vol) |
vol.111 |
Number (no) |
no.352 |
Page |
p.109 |
#Pages |
1 |
Date of Issue |
2011-12-08 (ICD) |