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Paper Abstract and Keywords
Presentation 2011-12-14 14:05
Small-signal and 30 GHz power characteristics of AlGaN/GaN heterostructure field-effect transistors with thin AlGaN barrier layers -- Effects of AlGaN barrier thinning --
Masataka Higashiwaki (NICT/JST), Yi Pei, Rongming Chu, Umesh K. Mishra (UCSB) ED2011-102 Link to ES Tech. Rep. Archives: ED2011-102
Abstract (in Japanese) (See Japanese page) 
(in English) Short-gate AlGaN/GaN heterostructure field-effect transistors (HFETs) with extremely thin AlGaN barrier layers were fabricated and characterized from the viewpoint of millimeter-wave applications. The devices showed good DC and RF small-signal characteristics; however, the 30 GHz power characteristics were degraded. The dispersive behavior of the thin-barrier devices measured in pulse {$I$}--{$V$} curves was different from the commonly observed one. We consider from these results that the unique dispersion of the thin-barrier HFETs was caused by the different charging path related to hot electrons accelerated in a high electric field region of a two-dimensional electron gas channel.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / heterostructure field-effect transistor (HFET) / millimeter-wave / frequency dispersion / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 338, ED2011-102, pp. 13-17, Dec. 2011.
Paper # ED2011-102 
Date of Issue 2011-12-07 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2011-102 Link to ES Tech. Rep. Archives: ED2011-102

Conference Information
Committee ED  
Conference Date 2011-12-14 - 2011-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Milimeter wave, terahertz device and systems 
Paper Information
Registration To ED 
Conference Code 2011-12-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Small-signal and 30 GHz power characteristics of AlGaN/GaN heterostructure field-effect transistors with thin AlGaN barrier layers 
Sub Title (in English) Effects of AlGaN barrier thinning 
Keyword(1) GaN  
Keyword(2) heterostructure field-effect transistor (HFET)  
Keyword(3) millimeter-wave  
Keyword(4) frequency dispersion  
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1st Author's Name Masataka Higashiwaki  
1st Author's Affiliation National Institute of Information and Communications Technology/PRESTO, Japan Science and Technology Agency (NICT/JST)
2nd Author's Name Yi Pei  
2nd Author's Affiliation University of California, Santa Barbara (UCSB)
3rd Author's Name Rongming Chu  
3rd Author's Affiliation University of California, Santa Barbara (UCSB)
4th Author's Name Umesh K. Mishra  
4th Author's Affiliation University of California, Santa Barbara (UCSB)
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Date Time 2011-12-14 14:05:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2011-102 
Volume (vol) vol.111 
Number (no) no.338 
Page pp.13-17 
#Pages
Date of Issue 2011-12-07 (ED) 


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