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Paper Abstract and Keywords
Presentation 2011-11-18 16:15
Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102 Link to ES Tech. Rep. Archives: EMD2011-102
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-oscillation and by another mechanism which gives periodical micro-sliding to electrical contacts directly driven by a magmetostrictive actuator or a piezo-electrical one. It was shown that each mechanism was able to make a test simulate an actual degradation phenomenon on electrical contacts by the influence of micro-oscillation. Using the above mechanisms and their models they have studied the influences of a micro-oscillation on contact resistance.
In this paper, it was shown that there was a degradation phenomenon of electrical contacts by experimental results using the micro-sliding mechanism (MSM). Using the results the authors discussed the degradation phenomena in shorter term, about a day, on four types of conditions that the input waveform as external force was sinusoidal or rectangular and frictional force between male-pins and female-pins in a connector was usual or smaller. Consequently it was shown that there were (1) the minimal sliding amplitudes causing contact resistance fluctuations of electrical contacts and (2) the amplitudes correlating input waveforms and contact frictional forces.
The authors recognized that the phenomena occurred more frequently in actual static contacts under the influence of some oscillation or vibration. Because there were some scratches on the surfaces in spite of almost zero of contact resistance, it was recognized that the degradation phenomena of electrical contacts could occurred more frequently in actual static contacts.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / degradation phenomenon / contact resistance / micro-sliding mechanism / hammering oscillating mechanism / frictional force / sliding amplitude / relative displacement  
Reference Info. IEICE Tech. Rep., vol. 111, no. 299, EMD2011-102, pp. 189-194, Nov. 2011.
Paper # EMD2011-102 
Date of Issue 2011-11-10 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-102 Link to ES Tech. Rep. Archives: EMD2011-102

Conference Information
Committee EMD  
Conference Date 2011-11-17 - 2011-11-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita Univ. Tegata Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2011 
Paper Information
Registration To EMD 
Conference Code 2011-11-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism 
Sub Title (in English) Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) 
Keyword(1) electrical contact  
Keyword(2) degradation phenomenon  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) hammering oscillating mechanism  
Keyword(6) frictional force  
Keyword(7) sliding amplitude  
Keyword(8) relative displacement  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Masahiro Kawanobe  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC System Co. Ltd. (TMC System)
5th Author's Name Naoki Masuda  
5th Author's Affiliation TMC System Co. Ltd. (TMC System)
6th Author's Name Akira Ishiguro  
6th Author's Affiliation TMC System Co. Ltd. (TMC System)
7th Author's Name Kunio Yanagi  
7th Author's Affiliation TMC System Co. Ltd. (TMC System)
8th Author's Name Hiroaki Kubota  
8th Author's Affiliation TMC System Co. Ltd. (TMC System)
9th Author's Name Koichiro Sawa  
9th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
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Speaker Author-1 
Date Time 2011-11-18 16:15:00 
Presentation Time 20 minutes 
Registration for EMD 
Paper # EMD2011-102 
Volume (vol) vol.111 
Number (no) no.299 
Page pp.189-194 
#Pages
Date of Issue 2011-11-10 (EMD) 


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