IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
... (for ESS/CS/ES/ISS)
Tech. Rep. Archives
... (for ES/CS)
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2011-11-11 11:00
Document-based Test Case Generation using RDF Store
Futoshi Iwama, Taiga Nakamura (IBMJ) KBSE2011-47
Abstract (in Japanese) (See Japanese page) 
(in English) Automation tool has made less progress in software testing based on document such as requirement and design than unit testing for programming code. Therefore, system-level test has pressing problems related to its quality and effectively. For improving such situation, we sort out problems that constitute main obstacle to automation in designing test cases based on documents and offer a versatile method for document based testcase generation. In the method, we first define primitive case model as a set of structural tags, which express important, fundamental and relatively extractable information for defining test cases, which are designed based on our experiences and insights gained through real projects. The method converts extracted text data into RDF data, puts the data into a RDF store, and annotates data in the RDF store with tags of the primitive case. After that it generates test cases using only the tag information in a uniform manner. This paper describes the method, implemented system, and some result from real projects.
Keyword (in Japanese) (See Japanese page) 
(in English) Testcase geneation / document based testing / RDF / tagging / / / /  
Reference Info. IEICE Tech. Rep., vol. 111, no. 282, KBSE2011-47, pp. 67-72, Nov. 2011.
Paper # KBSE2011-47 
Date of Issue 2011-11-03 (KBSE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF KBSE2011-47

Conference Information
Committee KBSE  
Conference Date 2011-11-10 - 2011-11-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Shinshu Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To KBSE 
Conference Code 2011-11-KBSE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Document-based Test Case Generation using RDF Store 
Sub Title (in English)  
Keyword(1) Testcase geneation  
Keyword(2) document based testing  
Keyword(3) RDF  
Keyword(4) tagging  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Futoshi Iwama  
1st Author's Affiliation IBM Japan (IBMJ)
2nd Author's Name Taiga Nakamura  
2nd Author's Affiliation IBM Japan (IBMJ)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2011-11-11 11:00:00 
Presentation Time 40 
Registration for KBSE 
Paper # IEICE-KBSE2011-47 
Volume (vol) IEICE-111 
Number (no) no.282 
Page pp.67-72 
#Pages IEICE-6 
Date of Issue IEICE-KBSE-2011-11-03 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan