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| Presentation | 2011-10-25 09:55 Near Infrared Reflected Intensity Based Material Recognition and Its Application Muhammad Attamimi, Tomoaki Nakamura, Takayuki Nagai (UEC Tokyo)  SIP2011-69 ICD2011-72 IE2011-68 Link to ES Tech. Rep. Archives: ICD2011-72 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this paper, near\--infrared (NIR) reflection intensity acquired from TOF camera is used for material recognition. Generally, NIR reflection intensity is determined by irradiation intensity, the reflectance factor of surface, incident angle and the distance to the object for diffuse reflection occurred on an object's surface. Since TOF camera is a device that can capture the depth of target object, the distance to the surface of target object and the information of normal direction can be measured from it. Therefore, it is possible to estimate the reflectance factor of surface if irradiation intensity is constant. Since the direct estimation of reflectivity coefficient is not needed, the distance to the object, incident angle and reflection intensity are utilized as a feature and multiple SVMs based learning of each material is employed in order to realize material recognition. Moreover, reflection intensity based material recognition is applied and the realization of cleaning task by autonomous mobile robot is considered. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | material recognition / near-infrared reflection intensity / TOF camera / object detection / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 257, SIP2011-69, pp. 43-48, Oct. 2011. | |
| Paper # | SIP2011-69 | |
| Date of Issue | 2011-10-17 (SIP, ICD, IE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SIP2011-69 ICD2011-72 IE2011-68 Link to ES Tech. Rep. Archives: ICD2011-72 |
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| Conference Information | |
| Committee | ICD IE SIP IPSJ-SLDM |
| Conference Date | 2011-10-24 - 2011-10-25 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ｉｃｈｉｎｏｂｏ(Sendai) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SIP |
| Conference Code | 2011-10-ICD-IE-SIP-SLDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Near Infrared Reflected Intensity Based Material Recognition and Its Application |
| Sub Title (in English) | |
| Keyword(1) | material recognition |
| Keyword(2) | near-infrared reflection intensity |
| Keyword(3) | TOF camera |
| Keyword(4) | object detection |
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| 1st Author's Name | Muhammad Attamimi |
| 1st Author's Affiliation | The University of Electro-Communications (UEC Tokyo) |
| 2nd Author's Name | Tomoaki Nakamura |
| 2nd Author's Affiliation | The University of Electro-Communications (UEC Tokyo) |
| 3rd Author's Name | Takayuki Nagai |
| 3rd Author's Affiliation | The University of Electro-Communications (UEC Tokyo) |
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| Speaker | Author-1 |
| Date Time | 2011-10-25 09:55:00 |
| Presentation Time | 25 minutes |
| Registration for | SIP |
| Paper # | SIP2011-69, ICD2011-72, IE2011-68 |
| Volume (vol) | vol.111 |
| Number (no) | no.257(SIP), no.258(ICD), no.259(IE) |
| Page | pp.43-48 |
| #Pages | 6 |
| Date of Issue | 2011-10-17 (SIP, ICD, IE) |
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