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| Presentation | 2011-10-21 15:55 On The Extended Cumulative Exposure Model, ECEM Hideo Hirose, Takenori Sakumura (Kyushu Inst. of Tech.)  R2011-32 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The cumulative exposure model (CEM) is often used to express the failure probability model in the step-up test method; the step-up procedure continues until a breakdown occurs. This probability model is widely accepted in reliability fields because accumulation of fatigue is considered to be reasonable. Contrary to this, the memoryless model (MM) is can be assumed because accumulation of fatigue is not observed in some cases. We propose here a new model, the extended cumulative exposure model (ECEM), which includes both the previous models. A Simulation study and an application to the actual experimental case of breakdown voltage tests of insulation oil support the validity of the proposed model. The independence model (IM), which has been used in electrical engineers, is also discussed. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | step-up tests / cumulative exposure model / memoryless model / extended cumulative exposure model / independence model / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 253, R2011-32, pp. 29-34, Oct. 2011. | |
| Paper # | R2011-32 | |
| Date of Issue | 2011-10-14 (R) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | R2011-32 |
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| Conference Information | |
| Committee | R |
| Conference Date | 2011-10-21 - 2011-10-21 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | R |
| Conference Code | 2011-10-R |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On The Extended Cumulative Exposure Model, ECEM |
| Sub Title (in English) | |
| Keyword(1) | step-up tests |
| Keyword(2) | cumulative exposure model |
| Keyword(3) | memoryless model |
| Keyword(4) | extended cumulative exposure model |
| Keyword(5) | independence model |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hideo Hirose |
| 1st Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
| 2nd Author's Name | Takenori Sakumura |
| 2nd Author's Affiliation | Kyushu Institute of Technology (Kyushu Inst. of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2011-10-21 15:55:00 |
| Presentation Time | 25 minutes |
| Registration for | R |
| Paper # | R2011-32 |
| Volume (vol) | vol.111 |
| Number (no) | no.253 |
| Page | pp.29-34 |
| #Pages | 6 |
| Date of Issue | 2011-10-14 (R) |
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