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Paper Abstract and Keywords
Presentation 2011-10-21 12:35
Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57 Link to ES Tech. Rep. Archives: EMD2011-57
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, the authors discussed the degradation phenomena of electrical contacts in shorter term, using the improved micro-sliding mechanism, on four conditions that the input waveform was sinusoidal or rectangular and frictional force between male-pins and female-pins in a connector was usual or smaller. Consequently it was shown that there were the minimal reciprocating-sliding amplitudes causing contact resistance fluctuations of electrical contacts and the amplitudes correlating input waveforms and contact frictional forces.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / sinusoidal waveform / rectangular waveform / frictional force / amplitude  
Reference Info. IEICE Tech. Rep., vol. 111, no. 254, EMD2011-57, pp. 1-6, Oct. 2011.
Paper # EMD2011-57 
Date of Issue 2011-10-14 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2011-57 Link to ES Tech. Rep. Archives: EMD2011-57

Conference Information
Committee EMD  
Conference Date 2011-10-21 - 2011-10-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Tachikawa-Shiminn-kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2011-10-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism 
Sub Title (in English) Contact Resistance (17) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) sinusoidal waveform  
Keyword(6) rectangular waveform  
Keyword(7) frictional force  
Keyword(8) amplitude  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC system Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC system Co. Ltd. (TMC)
3rd Author's Name Masahiro Kawanobe  
3rd Author's Affiliation TMC system Co. Ltd. (TMC)
4th Author's Name Saindaa Norovling  
4th Author's Affiliation TMC system Co. Ltd. (TMC)
5th Author's Name Naoki Masuda  
5th Author's Affiliation TMC system Co. Ltd. (TMC)
6th Author's Name Akira Ishiguro  
6th Author's Affiliation TMC system Co. Ltd. (TMC)
7th Author's Name Kunio Yanagi  
7th Author's Affiliation TMC system Co. Ltd. (TMC)
8th Author's Name Hiroaki Kubota  
8th Author's Affiliation TMC system Co. Ltd. (TMC)
9th Author's Name Koichiro Sawa  
9th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2011-10-21 12:35:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2011-57 
Volume (vol) vol.111 
Number (no) no.254 
Page pp.1-6 
#Pages
Date of Issue 2011-10-14 (EMD) 


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