Paper Abstract and Keywords |
Presentation |
2011-10-21 12:35
Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism
-- Contact Resistance (17) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57 Link to ES Tech. Rep. Archives: EMD2011-57 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some oscillating mechanisms in the vertical direction. In this paper, the authors discussed the degradation phenomena of electrical contacts in shorter term, using the improved micro-sliding mechanism, on four conditions that the input waveform was sinusoidal or rectangular and frictional force between male-pins and female-pins in a connector was usual or smaller. Consequently it was shown that there were the minimal reciprocating-sliding amplitudes causing contact resistance fluctuations of electrical contacts and the amplitudes correlating input waveforms and contact frictional forces. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / sinusoidal waveform / rectangular waveform / frictional force / amplitude |
Reference Info. |
IEICE Tech. Rep., vol. 111, no. 254, EMD2011-57, pp. 1-6, Oct. 2011. |
Paper # |
EMD2011-57 |
Date of Issue |
2011-10-14 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMD2011-57 Link to ES Tech. Rep. Archives: EMD2011-57 |
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